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Test method and tester for high frequency pulse signal

A high-frequency pulse and pulse signal technology, applied in the field of electronic signal parameter testing, can solve the problem of not being able to fully grasp the pulse signal, and achieve the effect of high-precision and fast measurement

Inactive Publication Date: 2017-05-31
SOUTHEAST UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at present, the oscilloscope is traditionally used to test several parameters of the signal, which often fails to achieve a comprehensive grasp of the pulse signal

Method used

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  • Test method and tester for high frequency pulse signal
  • Test method and tester for high frequency pulse signal

Examples

Experimental program
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Effect test

Embodiment 1

[0026] like figure 1 Shown is the structural block diagram of the high-frequency pulse signal tester of the present invention. The high-frequency pulse signal tester includes: frequency, duty cycle, and amplitude signal conditioning circuit, which is used to adjust the frequency, duty cycle, and amplitude of the input signal. The rise time signal conditioning circuit is used for conditioning the rise time of the input signal. The FPGA receives the signals output by each conditioning circuit, and measures the parameters of the high-frequency pulse signal, including frequency, duty cycle and rise time. The single-chip microcomputer measures the amplitude of the high-frequency pulse signal, and receives the measurement data of the FPGA in real time for data analysis. The single-chip microcomputer is connected to the rise time signal conditioning circuit through a D / A converter, and provides two threshold voltages for the rise time signal conditioning circuit. The measured high-...

Embodiment 2

[0028] like figure 2 As shown, the frequency, duty cycle and amplitude signal conditioning circuit of this embodiment uses a rail-to-rail high-speed comparator TLV3501 to shape the input pulse signals of different amplitudes into a square wave signal of 0-3.3V, and then input it into the FPGA. FPGA counts the standard pulse signal and the measured high-frequency pulse signal respectively within the gate time, and then calculates the frequency of the measured high-frequency pulse signal according to the count value of the two counters and the frequency of the standard pulse signal. In order to improve the sensitivity of the instrument and the maximum measurement range of the frequency, the gate time is set to 1s, and the standard pulse signal is generated by the standard pulse signal generator, which is a 1MHz clock signal.

[0029] MSP430 single-chip microcomputer is used, which can realize the instruction cycle of 40ns under the drive of 25MHz crystal, so as to realize the f...

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Abstract

The invention discloses a test method and a tester for a high frequency pulse signal. The frequency, the duty ratio, the amplitude, the rise time and other parameters of the high frequency pulse signal can be measured at high speed and high precision through the core of FPGA and real-time communication between the FPGA and a microcomputer. Through a high-speed comparator, input high frequency pulse signals of different amplitudes are rectified into square wave signals between 0 and 3.3V. The FPGA is input to measure the frequency and the duty ratio. Standard pulse signals are provided by standard rectangular pulse signal system parameter tests. The signal instantaneous amplitude is input into the microcomputer through A / D conversion. The microcomputer directly carries out data sampling and processing to acquire the high frequency signal amplitude. The microcomputer outputs threshold voltage of 10% and 90% amplitudes to the comparator. Two rectified signals are sent into the FPGA. A time interval measuring method is used to acquire the rise time. According to the invention, high-speed and high-precision test of the high frequency pulse signal can be realized.

Description

technical field [0001] The invention relates to a high-precision rapid testing method and a testing instrument for high-frequency pulse signals, belonging to the field of electronic signal parameter testing. Background technique [0002] With the rapid development of modern electronic technology, the requirements for the measurement accuracy and speed of pulse signals are getting higher and higher. Serious threat to the electromagnetic environment, the radar radiation source has the characteristics of high density, full frequency band coverage, frequency agility, and repetition frequency change. By measuring the parameters of the radar video pulse signal, the pulse frequency, pulse amplitude, pulse rise time and pulse frequency can be obtained. Width and other time-domain parameters, to obtain information such as the model and threat level of the enemy's radiation source, so as to identify and locate the target [0003] Pulse signals contain rich high frequency and low freq...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/04G01R19/25
CPCG01R23/04G01R19/2503
Inventor 张一荻
Owner SOUTHEAST UNIV
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