Vertically structured ZnMgO self-driven solar blind UV photodetector area array and preparation method thereof
A vertical structure, electrical detector technology, applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of low stability, difficult preparation of pn junction ZnMgO solar-blind ultraviolet photodetectors, etc., to enhance performance and achieve imaging and tracking, improving collection efficiency
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Embodiment 1
[0030] See attached figure 2 , using the magnetron sputtering coating method to grow a layer of ultra-wide bandgap, high carrier concentration doped Zn on the quartz substrate 1 x Mg 1-x O thin film is used as the transparent conductive window layer 2, and the doped impurity element is Al, and ZnO target, MgO target and Al 2 o 3 The targets are Zn source, Mg source and Al doping source respectively, the sputtering power is 50W, 100W and 30W respectively, and the grown Zn x Mg 1- x O thin film is used as the transparent conductive window layer 2, which is obtained through experiments: the value of x in the formula is 0.48, the bandgap width is 5.1eV, and the carrier concentration is 2×10 19 / cm 3 (See figure 2 Process a) in the process; continue to use the magnetron sputtering coating method to grow a layer of sun-blind bandgap, low carrier concentration doped Zn y Mg 1-y The O thin film is used as the n-type layer 3, and the doped impurity element is Al, and ZnO tar...
Embodiment 2
[0032] See attached figure 2 , using the pulsed laser deposition coating method to grow a layer of ultra-wide bandgap, high carrier concentration doped Zn on the alumina substrate 1 x Mg 1-x The O thin film is used as the transparent conductive window layer 2, and the doped impurity element is In, using ZnO target, MgO target and In 2 o 3 The targets are Zn source, Mg source and In doping source respectively, and the energy density of the pulsed laser source is 1.7 J / cm 2 、2.0J / cm 2 and 0.7J / cm 2 , the grown Zn x Mg 1-x O thin film is used as the transparent conductive window layer 2, which is obtained through experiments: the value of x in the formula is 0.45, the bandgap width is 5.3eV, and the carrier concentration is 1.5×10 19 / cm 3 (See figure 2 Process a) in the process; continue to use the pulsed laser deposition coating method to grow a layer of sun-blind bandgap, low carrier concentration doped Zn y Mg 1-y The O thin film is used as the n-type layer 3, an...
Embodiment 3
[0034] See attached figure 2 , using the magnetron sputtering coating method to grow a layer of ultra-wide bandgap, high carrier concentration doped Zn on the alumina substrate 1 x Mg 1-x O thin film is used as the transparent conductive window layer 2, and the doped impurity element is Ga, and ZnO target, MgO target and Ga 2 o 3 The targets are Zn source, Mg source and Ga doping source respectively, the sputtering power is 45W, 100W and 30W respectively, and the grown Zn x Mg 1- x O thin film is used as the transparent conductive window layer 2, which is obtained through experiments: the value of x in the formula is 0.44, the bandgap width is 5.4eV, and the carrier concentration is 1.1×10 19 / cm 3 (See figure 2 Process a) in the process; continue to use the magnetron sputtering coating method to grow a layer of sun-blind bandgap, low carrier concentration doped Zn y Mg 1-y The O thin film is used as the n-type layer 3, and the doped impurity element is Ga, and ZnO ta...
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