3results about How to "Solve preparation difficulties" patented technology

The application discloses a method for separating and purifying waxberry protoplasts. The method mainly comprises the following steps: culturing and obtaining sterile seedlings or cluster seedlings of the waxberry, and selecting tender new leaves at the top of the second to third leaves; cutting the leaves into strips and then placing the leaves in a permeation liquid for pretreatment; then placing the leaves in an enzymolysis liquid containing cellulase R-10, dissociation enzyme R-10 and pectinase Y-23, and performing enzymolysis under constant temperature, darkness and shaking conditions; and finally filtering through a cell sieve, centrifuging and resuspending to obtain the waxberry protoplasts. The yield of the protoplasts obtained by using the method is as high as 3.56x10 6 The application realizes efficient separation and purification of the waxberry protoplasts for the first time, and provides a key technical basis for molecular breeding and genetic improvement of the waxberry.

The invention discloses an N-phase TLVR integrated inductor, a multi-phase module, an IPM with small parasitic inductance and a power supply system of a semiconductor chip, the integrated inductor and the IPM form the power supply system of the multi-phase module and the semiconductor chip, and the N-phase integrated inductor is provided with a copper sheet, so that the parasitic inductance of an input power loop and an auxiliary winding loop is small, and the parasitic inductance of the power supply is small. Therefore, the semiconductor chip power supply system has relatively low dynamic inductance so as to realize relatively fast dynamic performance, and has relatively high steady-state inductance so as to realize relatively high efficiency.

The application provides a method and device for preparing a three-dimensional atom probe needle tip of a low-Mohs hardness geological sample, and belongs to the technical field of material preparation. The method provided by the application comprises the following steps: depositing a Pt protective layer on a target region; milling the periphery of the Pt protective layer on the geological sample by using an ion beam to form a three-prism-shaped long strip sample, and transferring the three-prism-shaped long strip sample to a silicon column; tilting a sample table to make the direction of the ion beam be perpendicular to the top surface of the sample welded on the silicon column and downward, determining the size parameters of a ring cutting step and a ring-shaped ion beam, and performing multiple ring cutting on the sample on the silicon column until the sample on the silicon column is processed into a target shape. The method and device for preparing the three-dimensional atom probe needle tip of the low-Mohs hardness geological sample can make the complex ring cutting process be streamlined, reduce the preparation difficulty of the needle tip sample, and improve the operability and success rate of sample preparation by refining the ring cutting step and optimizing the size parameters of the ring-shaped ion beam.