Composite trench MOS device and manufacturing method thereof
A MOS device and composite technology, applied in semiconductor/solid-state device manufacturing, electric solid-state devices, semiconductor devices, etc., can solve the problems of occupying chip area and cost, occupying silicon surface area, large chip area, etc., and achieve manufacturing cost reduction , high product performance, simple production process
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[0052] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0053] An embodiment of the present invention provides a composite trench MOS device, such as figure 1 As shown, the device includes a drain region of the first conductivity type, an N+ monocrystalline silicon substrate 1 and an N- epitaxial layer 2 located above the drain region of the first conductivity type, and an N-epitaxial layer located above the N- epitaxial layer 2 The first conductivity type P-type well region layer 3, the second conductivity type source region layer 4 located above the first conductivity type P-type well region layer 3, the second conductivity type source region layer 4 ...
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