High-throughput facility crop three-dimensional morphology information measurement system based on space carving technique
A three-dimensional shape and information measurement technology, applied in the direction of measuring devices, color measuring devices, instruments, etc., can solve problems such as weak applicability, low precision, and complex growth environment, and achieve fast speed, high measurement accuracy, and strong applicability. Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0021] The high-throughput facility crop three-dimensional shape information measurement system of the present invention is the core equipment of a modern plant factory, and realizes the automatic high-throughput measurement function of the three-dimensional shape of crops. measurement area. In the present invention, only the embodiment of the high-throughput facility crop three-dimensional shape information measurement system is described in detail, and the a...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com