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A kind of manufacturing method of light-emitting diode epitaxial wafer

A technology of light-emitting diodes and manufacturing methods, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., and can solve the problems of low production capacity of epitaxial wafers

Active Publication Date: 2020-07-07
HC SEMITEK ZHEJIANG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to solve the problem of low production capacity of epitaxial wafers in the prior art, an embodiment of the present invention provides a method for manufacturing a light-emitting diode epitaxial wafer

Method used

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  • A kind of manufacturing method of light-emitting diode epitaxial wafer
  • A kind of manufacturing method of light-emitting diode epitaxial wafer
  • A kind of manufacturing method of light-emitting diode epitaxial wafer

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Experimental program
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Effect test

Embodiment 1

[0042] An embodiment of the present invention provides a method for manufacturing a light-emitting diode epitaxial wafer, see figure 1 , the manufacturing method includes:

[0043] Step 101: Baking the graphite disk to clean the surface of the graphite disk.

[0044]As mentioned above, when growing buffer layer, N-type semiconductor layer, multiple quantum well layer, electron blocking layer and P-type semiconductor layer on the substrate, there is no substrate shielding on the substrate and the graphite disk for placing the substrate. The reactants generated during the growth process will be deposited on the area, and the reactants deposited on the graphite disk are called coating. As the growth progresses, the coating on the graphite disk becomes more and more. When the coating on the graphite disk reaches a certain level, it will hinder the deposition of reactants on the substrate. In this embodiment, the graphite disk is baked to remove The coating on the graphite disk c...

Embodiment 2

[0094] An embodiment of the present invention provides a method for manufacturing a light-emitting diode epitaxial wafer, and the manufacturing method provided in this embodiment is a specific realization of the manufacturing method provided in Embodiment 1.

[0095] In this embodiment, after the graphite disk is baked and the surface of the graphite disk is cleaned, four substrates are placed on the graphite disk in turn to form an epitaxial wafer. Specifically, when growing the quantum well layer in the multiple quantum well layer on each substrate, the growth temperature is 853.2°C, and the flow rate of the gas containing indium element in the MO source into the MOCVD reaction chamber is 700 sccm.

[0096] The detection of the four epitaxial wafers formed revealed that the first epitaxial wafer formed on the substrate placed on the graphite disk had a luminous wavelength of 468.4nm and a luminous brightness of 20.4mw; the second epitaxial wafer placed on the graphite disk T...

Embodiment 3

[0099] An embodiment of the present invention provides a method for manufacturing a light-emitting diode epitaxial wafer, and the manufacturing method provided in this embodiment is another specific implementation of the manufacturing method provided in Embodiment 1.

[0100] In this embodiment, after the graphite disk is baked and the surface of the graphite disk is cleaned, four substrates are placed on the graphite disk in turn to form an epitaxial wafer. Specifically, when growing quantum well layers in multiple quantum well layers on each substrate, the flow rate of the gas containing indium in the MO source into the MOCVD reaction chamber is 700 sccm; the first one is placed on the substrate on the graphite disk When growing the quantum well layer in the multi-quantum well layer, the growth temperature is 853.2°C; when the second one is placed on the substrate on the graphite disk to grow the quantum well layer in the multi-quantum well layer, the growth temperature is 85...

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Abstract

The invention discloses a light emitting diode epitaxial wafer preparation method, which belongs to the technical field of semiconductors. The method comprises steps: a graphite plate is baked, and the surface of the graphite plate is cleaned; after the graphite plate is placed in a MOCVD (Metal-organic Chemical Vapor Deposition) reaction cavity, multiple substrates are placed on the graphite plate by turns, when each substrate is placed on the graphite plate, an MO source is fed to the MOCVD reaction cavity, a buffer layer, an N-type semiconductor layer, multiple quantum well layers, an electron barrier layer and a P-type semiconductor layer grow on the substrate sequentially, and an epitaxial wafer is formed, the multiple quantum well layers comprise multiple quantum well layers and multiple quantum barrier layers stacked alternately, and the quantum well layer is made of InGaN. After the surface of the graphite plate is cleaned once, epitaxial wafers are formed on the multiple substrates by turns, the graphite plate surface cleaning times can be greatly reduced, and the production capacity of the epitaxial wafers is greatly improved.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a method for manufacturing a light-emitting diode epitaxial wafer. Background technique [0002] A light-emitting diode (English: Light Emitting Diode, referred to as: LED) is a semiconductor electronic component that can emit light. According to the wavelength of light emitted, LEDs can be divided into blue-green LEDs and ultraviolet LEDs. The chip is the most important part of the LED, which has excellent characteristics of high thermal conductivity, high temperature resistance, corrosion resistance and high hardness. [0003] Epitaxial wafers are the raw material for chip fabrication. When manufacturing epitaxial wafers, it is necessary to place the graphite disk in the metal organic compound chemical vapor deposition (English: Metal-organic Chemical Vapor Deposition, abbreviation: MOCVD) reaction chamber, and then place the substrate in the groove in the middle of th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/67H01L33/00
CPCH01L21/67276H01L33/0075
Inventor 武艳萍万林胡加辉
Owner HC SEMITEK ZHEJIANG CO LTD