Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

A Detection Method of Voltage Flicker Parameters Based on Combined Window Function

A combined window function and voltage flicker technology, applied in the direction of testing dielectric strength, detecting faults according to conductor type, fault location, etc., can solve the problems of inaccurate detection accuracy of voltage flicker parameters, so as to expand the complexity and improve the detection accuracy. The effect of improving the accuracy and window function performance

Active Publication Date: 2020-07-03
HUNAN UNIV
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problems existing in the prior art, and to provide a voltage flicker parameter detection method, which is based on the rectangular modulation of the K-RV interconvolution window of the improved energy operator, and can solve the problem of the prior art on the voltage The technical problem that the detection accuracy of flicker parameters is not accurate enough

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Detection Method of Voltage Flicker Parameters Based on Combined Window Function
  • A Detection Method of Voltage Flicker Parameters Based on Combined Window Function
  • A Detection Method of Voltage Flicker Parameters Based on Combined Window Function

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0049] The present invention provides a research on the rapid and accurate detection of voltage flicker under rectangular modulation. Firstly, an improved Teager energy operator for interval sampling is established, based on which the voltage flicker envelope signal under rectangular modulation is extracted; a narrower main lobe is constructed. Kaiser and Rife-Vincent cross-convolution adaptive optimization window function with fast sidelobe attenuation (hereinafter referred to as K-RV inter-convolution adaptive optimization window), deduces the three-line interpolation improved FFT spectrum correction algorithm for extracting fluctuation components, according to This paper proposes a new method for rectangular modulation flicker detection based on the new K-RV interconvolution window of the improved energy operator, and gives the judgment basis for modulation waveform identification. Finally, a large number of simulation experiments are used to verify the effectiveness and feas...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a voltage flicker parameter detection method based on a combined window function. The voltage flicker parameter detection method comprises the following steps: S201, by utilizing a Teager energy operator function improved on the basis of interval K point sampling, and at the aim of an established modulation model for rectangular wave voltage flicker signals, extracting andobtaining a component v(n) of a voltage flicker envelope signal; S202, performing windowing correction on the obtained component v(n) of the voltage flicker envelope signal by adopting an establishedK-RV mutual convolution window function so as to obtain a voltage flicker envelope signal component y(n) subjected to windowing correction; S203, performing spectral analysis on the voltage flicker envelope signal component y(n) by utilizing three spectral line interpolation FFT, so as to obtain an amplitude correction function and a frequency correction function of the voltage flicker envelope signal. According to the method disclosed by the invention, the detection accuracy of voltage flicker can be greatly improved, a determining criterion is provided for classifying flicker modulation waveforms, and studies on voltage flicker modulation waveform complexity of amplitude-modulated waves are expanded.

Description

technical field [0001] The invention relates to the field of power systems, in particular to a method for detecting voltage flicker parameters based on a combined window function. Background technique [0002] The sharp increase of power load, especially the impact load, will easily lead to grid voltage instability, voltage fluctuation and voltage flicker, which will seriously affect industrial production and daily life. Among them, voltage flicker is an important cause of failure and failure of power supply and consumption equipment, so it is one of the important parameters of power quality. Therefore, it is necessary to accurately detect voltage flicker, which can detect voltage flicker with high precision, so as to provide early warning for the power system to take measures. [0003] Most of the existing voltage flicker signal detection methods use Fast Fourier Transformation (FFT) for calculation, but this method takes up a large amount of RAM storage space during calcu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/12G01R31/08G01R23/16
CPCG01R23/16G01R31/086G01R31/12
Inventor 高云鹏张韵琦吴聪曹一家夏睿周金张民谣滕召胜黎灿兵边文婷梁联晖赵恒一李珏邹同华卿宗胜
Owner HUNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com