Fault locating device for testing industrial measurement and control instrument
A fault location and instrumentation technology, applied in measuring devices, electronic circuit testing, and optical devices, etc., can solve the problems of no image monitoring function, inability to view easily, and inability to accurately give the location of the fault, etc. Improve calibration efficiency, timely repair and maintenance, and reduce reflection effects
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[0043] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0044] Such as figure 1 As shown, the present invention provides a fault location device for testing industrial measurement and control instruments, including a wireless acquisition terminal 1 for distributed installation at each measurement and control point and a positioning control server 2 for fixed installation at a monitoring center. The control server 2 forms a star topology with a plurality of wireless collection terminals 1, and transmits signals thro...
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