Etching method for patterned sapphire substrate
A technology for patterning sapphire and sapphire substrates, applied in electrical components, circuits, semiconductor devices, etc., can solve problems such as poor pattern consistency, rough etching surface, etc., achieve strong anti-static ability, high luminous power, improve The effect of precision
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Embodiment 1
[0042] This embodiment provides a method for etching a patterned sapphire substrate, which is used for more precise etching of the sapphire substrate, and has the advantages of good pattern consistency and high etching precision. Such as figure 1 Shown is the flowchart of the etching method of patterned sapphire substrate, and this method comprises the following steps:
[0043] S101: providing a sapphire substrate;
[0044] S102: Coating the positive photoresist on the surface of the sapphire substrate, sending the sapphire substrate coated with the positive photoresist to the hot plate for the first baking, the baking temperature is 90-110°C, The baking time is 60~120s;
[0045] Photoresist is divided into positive photoresist and negative photoresist. The positive photoresist is the one that becomes soluble after being illuminated. Using this property, the photoresist can be used as a coating to Etch the required circuit pattern on the surface of the sapphire substrate. ...
Embodiment 2
[0060] On the basis of Example 1, this embodiment provides a preferred method for etching a sapphire substrate, such as figure 2 Shown is a flow chart of another etching method for a sapphire substrate. The method includes the following steps:
[0061] S201: providing a sapphire substrate;
[0062] S202: After ultrasonically cleaning the sapphire substrate with acetone or isopropanol, rinse with deionized water, heat and clean with a mixture of sulfuric acid and hydrogen peroxide, and rinse with deionized water. Wherein, the mass fractions of sulfuric acid and hydrogen peroxide are 98% and 30% respectively, and the volume ratio of sulfuric acid and hydrogen peroxide is 3:1˜4:1.
[0063] S203: Coating the positive photoresist on the surface of the sapphire substrate, sending the sapphire substrate coated with the positive photoresist to the hot plate for the first baking, the baking temperature is 90-110°C, The baking time is 60~120s;
[0064] Photoresist is divided into p...
Embodiment 3
[0078] In this example, a total of 2000 samples of sample P1 were produced according to the methods provided in Examples 1 and 2, and a total of 2000 samples of P2 were formed for comparison. Wherein, the comparison method of making sample P2 is described as follows:
[0079] S301: providing a sapphire substrate;
[0080] S302: Coat the positive photoresist on the surface of the sapphire substrate, send the sapphire substrate coated with the positive photoresist to the hot plate for the first baking, the baking temperature is 105°C, and bake The time is 60s;
[0081] S303: Send the sapphire substrate after the first baking to a cold plate at 23°C for the first cooling, the cooling time is 30s, and form a photolithography mask with a film thickness of 2.3um on the surface of the sapphire substrate;
[0082] S304: For the sapphire substrate after cooling for the first time, control the exposure focal length between -0.3~0.3um, the exposure time is 200ms, and the pattern diamet...
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Abstract
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