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An Infrared Broad Spectrum Light Absorber Based on Semiconductor Materials

A semiconductor and wide-spectrum technology, applied in the field of infrared wide-spectrum light absorbers, can solve the problems of difficult precise, continuous and controllable porosity, and achieve the effects of superior absorption performance, expanded range, and wide applicability

Active Publication Date: 2020-09-08
WUHAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The porosity of traditional metal or semiconductor nanocones, nanorods, nanoporous structures, etc., is difficult to be precisely and continuously controllable and greater than 80%, which brings challenges to efficient light absorbers

Method used

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  • An Infrared Broad Spectrum Light Absorber Based on Semiconductor Materials
  • An Infrared Broad Spectrum Light Absorber Based on Semiconductor Materials
  • An Infrared Broad Spectrum Light Absorber Based on Semiconductor Materials

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] The silicon substrate is ultrasonically cleaned with acetone and ethanol in sequence, and the silicon substrate is treated with oxygen plasma to improve the hydrophilicity of the silicon substrate. The oxygen plasma treatment power is 50W-500W, and the treatment time is 10 minutes. A single-layer PS ball array was prepared on a silicon substrate, and the single-layer PS ball array was used as a ball array template, and Al was deposited on the ball array template by atomic layer deposition 2 o 3 film. After annealing to remove the ball array template, a single layer of Al with a thickness of 5nm to 1000nm and a spherical shell diameter of 50nm to 100000nm can be obtained on the silicon substrate 2 o 3 Array of hollow spherical shells.

[0047] Dilute and dissolve the silicon particles with isopropanol to obtain a silicon particle dilution, and then ultrasonically disperse. Under the condition of rotating speed of 800rpm~5000rpm, in single layer Al 2 o 3 The silicon...

Embodiment 2

[0049] The silicon substrate is ultrasonically cleaned with acetone and ethanol in sequence, and the silicon substrate is treated with oxygen plasma to improve the hydrophilicity of the silicon substrate. The oxygen plasma treatment power is 50W-500W, and the treatment time is 10 minutes. Repeat the following steps (1) to (3) three times:

[0050] (1) A single layer of Al with a thickness of 5nm to 1000nm and a spherical shell diameter of 50nm to 100000nm is made by the transfer method 2 o 3 The array of hollow spherical shells was transferred to a silicon substrate. Specifically, single-layer Al 2 o 3 The hollow spherical shell array is peeled off from the substrate, and then glued to the silicon substrate; the silicon substrate is heated at a temperature of 80 ° C to 200 ° C for 3 min to 20 min, so that the heat release tape loses its viscosity, so that the Al 2 o 3 The array of hollow spherical shells is left on the silicon substrate;

[0051] (2) Dilute and dissolve ...

Embodiment 3

[0055] The silicon substrate is ultrasonically cleaned with acetone and ethanol in sequence, and the silicon substrate is treated with oxygen plasma to improve the hydrophilicity of the silicon substrate. The oxygen plasma treatment power is 50W-500W, and the treatment time is 10 minutes. A single-layer PS ball array was prepared on a silicon substrate, and the single-layer PS ball array was used as a ball array template, and Al was deposited on the ball array template by atomic layer deposition 2 o 3 film. After annealing to remove the ball array template, a single layer of Al with a thickness of 5nm to 1000nm and a spherical shell diameter of 50nm to 100000nm can be obtained on the silicon substrate 2 o 3 Array of hollow spherical shells.

[0056] will be attached with Al 2 o 3 The silicon substrate of the hollow spherical shell array is placed in the magnetron sputtering chamber, with high-purity metal In as the target material, nitrogen as the nitrogen source, and arg...

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Abstract

The invention discloses a semiconductor material-based infrared broad spectrum light absorber. The semiconductor material-based infrared broad spectrum light absorber is prepared and obtained by the following method: (1) ultrasonically cleaning a substrate, and treating the ultrasonically cleaned substrate with oxygen plasmas; (2) preparing or transferring a single layer of or multiple layers of Al2O3 hollow spherical shell arrays on the substrate; (3) depositing semiconductor particles or semiconductor thin films on the Al2O3 hollow spherical shell arrays; and (4) annealing the deposited semiconductor particles or semiconductor thin films, thus obtaining the infrared broad spectrum light absorber. The infrared broad spectrum light absorber disclosed by the invention is flexible in structure; and the structure of the infrared broad spectrum light absorber can be changed by changing the number of layers of the hollow spherical shell arrays, the size, the cycle and the thickness of a spherical shell, so that the semiconductor material-based infrared broad spectrum light absorber can meet a requirement of reducing reflection within an extremely wide wavelength range, and the applicability is high.

Description

technical field [0001] The invention relates to an infrared wide-spectrum light absorber based on semiconductor materials. Background technique [0002] Infrared detection technology not only plays an important role in aerospace, meteorological satellites, space early warning and other fields, but also plays an important role in medical imaging, industrial testing, environmental monitoring and other fields. Whether detecting infrared signals or suppressing background stray light in the environment, the efficient capture of infrared light is the most critical step. For cutting-edge infrared detection technology, high-performance infrared light absorbers play an important role. [0003] The introduction of metal nanoparticles into the light absorber, based on the surface plasmon resonance, is of great significance for light absorption. Surface plasmons refer to the collective electronic resonance behavior that occurs at the interface between metals or semiconductors and diel...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B5/00G02B5/22G01J3/42G01N21/35
CPCG01J3/42G01N21/35G02B5/003G02B5/22
Inventor 刘昌张恒吴昊李慧
Owner WUHAN UNIV