Visual inspection method and apparatus for secondary printing precision of crystalline silicon photovoltaic solar cell electrodes

A solar cell and visual inspection technology, which is applied in circuits, electrical components, semiconductor/solid-state device testing/measurement, etc., can solve the problems of increasing equipment costs, increasing the amount of image processing operations, etc., achieving high robustness and reducing grid lines. The effect of testing costs

Pending Publication Date: 2019-02-19
FOLUNGWIN AUTOMATIC EQUIP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] For large-area ordinary solar cells, if a single camera is used as a detection device, a very high-pixel camera is required, which will not only increase the cost of the device, but also greatly increase the computational load of image processing

Method used

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  • Visual inspection method and apparatus for secondary printing precision of crystalline silicon photovoltaic solar cell electrodes
  • Visual inspection method and apparatus for secondary printing precision of crystalline silicon photovoltaic solar cell electrodes
  • Visual inspection method and apparatus for secondary printing precision of crystalline silicon photovoltaic solar cell electrodes

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Embodiment

[0053] Such as figure 1 As shown, a kind of crystalline silicon photovoltaic solar cell electrode secondary printing accuracy visual inspection method of the present invention comprises the following steps:

[0054] (1) Install the array camera and set the parameters, and calibrate the cameras in the camera array by customizing the optical calibration plate and combining with the calibration algorithm. After the calibration is completed, take out the optical calibration plate; the printing machine starts to print the silicon wafer grid lines;

[0055] (2) After each printing of the printing machine, the printed silicon wafer is rotated 90 degrees by the rotating positioning platform and sent to the photographing station under the array camera, and the array camera is triggered to take pictures at the same time, and then the photographed silicon wafer image is transmitted to the central processing device;

[0056] (3) the central processing unit extracts the edge of the silico...

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Abstract

The invention discloses a visual inspection method for secondary printing precision of crystalline silicon photovoltaic solar cell electrodes. Devices to implement the method mainly include an array camera, a camera fixture, a rotary positioning platform, a frame, a printing table and a control system; the control system is used for controlling the rotary positioning platform and controlling waferimage acquisition and algorithmic processing. The method herein includes: mounting the rotary positioning platform, calibrating the array camera, using the calibrated array camera to take pictures for a silicon wafer that is secondarily printed, extracting wafer grating edges from the pictures by a machine vision processing algorithm, detecting width of wafer gratings, and recognizing and locating positions of markers; calculating deviations between secondarily printed gratings and primarily printed gratings according to the grating widths and positional information of the markers detected bycameras of the array camera through the control system. The visual inspection method and system herein have the advantages of high recognition speed, good stability and the like.

Description

technical field [0001] The invention relates to computer vision detection technology, in particular to a method and device for visual detection of secondary printing accuracy of crystalline silicon photovoltaic solar cell electrodes. Background technique [0002] Crystalline silicon solar photovoltaic cell printing equipment is a printing system based on machine vision to fully realize the printing of screens and substrates. In order to adapt to the production requirements of high efficiency and high precision crystalline silicon solar cells, it has become necessary to use computer vision to quickly and accurately detect silicon wafers produced by printing equipment. [0003] For large-area ordinary solar cells, if a single camera is used as the detection device, a very high-pixel camera is required, which will not only increase the cost of the device, but also greatly increase the computational load of image processing. In fact, for the detection of grid line printing accu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66
CPCH01L22/12H01L22/20
Inventor 张宪民黄炽豪黄大榕冼志军
Owner FOLUNGWIN AUTOMATIC EQUIP CO LTD
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