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A SICM voltage modulation imaging device and method based on differential noise reduction

A technology of voltage modulation and imaging device, applied in measurement devices, instruments, scanning probe microscopy, etc., can solve the problem that the signal-to-noise ratio cannot be further improved, so as to increase the effective signal-to-noise ratio and improve the Z-direction resolution , the effect of increasing the Z resolution

Active Publication Date: 2020-12-29
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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AI Technical Summary

Problems solved by technology

When the system hardware and environmental conditions are fixed, the noise level remains unchanged, and the amplitude of the effective signal can be increased by increasing the driving voltage across the electrodes, but limited by the input range of the lock-in amplifier, the driving voltage can only be increased within a limited range , so the signal-to-noise ratio cannot be further improved

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  • A SICM voltage modulation imaging device and method based on differential noise reduction
  • A SICM voltage modulation imaging device and method based on differential noise reduction
  • A SICM voltage modulation imaging device and method based on differential noise reduction

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Embodiment Construction

[0067] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0068] A SICM voltage modulation imaging device based on differential noise reduction, comprising:

[0069] Voltage drive unit: The signal generator generates an AC voltage of a certain frequency, amplitude, and phase, which provides a reference voltage and modulation signal for the lock-in amplifier; at the same time, the AC signal generated by the signal generator is used as a driving voltage to be applied to the electrode through the patch clamp amplifier Both ends provide terminal voltage for the electrode-probe-solution circuit;

[0070] Current detection unit: use the patch clamp amplifier to detect the weak current signal, and transmit it to the lock-in amplifier after being amplified by the internal I-V converter of the patch clamp amplifier;

[0071] Signal modulation unit: Through capacitance compensation and multiple differential noise reduction s...

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Abstract

The invention relates to a differential-noise-reduction-based SICM voltage modulation imaging device and method. The device comprises a voltage driving unit, a current detecting unit, a signal modulating unit, a feedback control unit and a mechanism executing unit. In addition, the method includes the flowing steps that: a signal generator generates two paths of co-frequency alternating current voltages, wherein one path of voltage is connected to a patch clamp amplifier to serve as a driving voltage and the other path of voltage is connected to a lock-in amplifier to serve as a reference voltage; capacitance compensation is performed by the patch clamp amplifier; one path of modulation voltage having the same frequency and same phase as the reference signal is connected to the lock-in amplifier to carry out feedback signal modulation; calculation is carried out to obtain a new current setting value; and the lock-in amplifier feeds back an extracted current component to a controller, adistance between the probe and the sample is controlled, a track of the relative displacement of the probe and the sample is recorded, and thus image scanning is completed. According to the invention, the feedback signal is modulated to increase the amplitude of the driving voltage, so that the signal-to-noise ratio of the system is improved and thus the Z-direction resolution ratio and the scanning speed of the SICM system are improved.

Description

technical field [0001] The invention relates to a novel fast and high-resolution micro-nano-level non-contact imaging technology, in particular to a scanning device and method based on differential noise reduction scanning ion conductance microscope (SICM) voltage modulation imaging mode. Background technique [0002] At present, scanning ion conductance microscope (SICM) is a scanning probe microscopy technique for imaging at the nanoscale and characterizing biological samples in various ways. It has been widely used in biology, medicine, chemistry, materials and many other fields. The biggest feature of SICM is that it can conduct non-destructive observation of living cells under physiological conditions, and does not require pretreatment such as fluorescent labeling of samples. Therefore, it is a high-resolution, high-fidelity imaging technology. The method is especially suitable for the observation of soft samples such as living cells. SICM uses a hollow glass tube wit...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/44
CPCG01Q60/44
Inventor 刘连庆滕泽宇杨洋于鹏杨铁李广勇
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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