Low-dose-rate irradiation damage enhancement effect judgment method

A technology with low dose rate and enhanced effect, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., to achieve the effect of reducing radiation risk and high reliability

Active Publication Date: 2019-03-26
CHINA ACADEMY OF SPACE TECHNOLOGY
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  • Description
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  • Application Information

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Problems solved by technology

[0005] The technical problem of the present invention is: to overcome the deficiencies of the prior art, a method for judging the enhancement effect of low dose rate radi...

Method used

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  • Low-dose-rate irradiation damage enhancement effect judgment method
  • Low-dose-rate irradiation damage enhancement effect judgment method
  • Low-dose-rate irradiation damage enhancement effect judgment method

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Experimental program
Comparison scheme
Effect test

Embodiment

[0048] Test device selection

[0049] The G7J139MJ type low power consumption, low offset four-voltage comparator produced by Jinzhou 777 Factory was selected as the tested device.

[0050] The radiation source is a cobalt 60 gamma ray source, and the inhomogeneity of the radiation field within the irradiated area of ​​the test sample is less than 10%. The uncertainty of radiation dose rate is less than 5%. Radiation ambient temperature requirements: 15°C to 30°C. Two dose rates of 0.005rad(Si) / s and 50rad(Si) / s were used to irradiate 7J139 devices, and parameters such as input offset voltage, power supply current, input bias current, input offset current, and open-loop voltage gain were mainly tested. .

[0051] The test circuit board requirements are as follows:

[0052] a) Device sockets that are not sensitive to radiation should be selected to make test circuit boards, and the device sockets should not affect the uniformity of the radiation field. Other components on ...

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Abstract

The invention discloses a low-dose-rate irradiation damage enhancement effect judgment method. The method comprises the following steps: 1) obtaining an electrical parameter test result of a to-be-tested object before irradiation; 2) manufacturing a plurality of irradiation test circuit boards, and carrying out ionization irradiation tests with different dose rates and different offsets to obtainelectrical parameter test results of a plurality of irradiation dose points; 3) determining the ratio of the electrical parameter degradation amount of the to-be-tested object and the electrical parameter degradation reliability influence factor of the to-be-tested object; and 4) judging whether the to-be-tested object has low-dose-rate irradiation damage enhancement effect or not according to theratio of the electrical parameter degradation amount and the electrical parameter degradation reliability influence factor. According to the method, high-dose-rate irradiation tests and low-dose-rateirradiation tests are carried out separately, high-dose-rate and low-dose-rate comparison data are obtained, the component parameter degradation factor and the low-dose-rate irradiation damage enhancement factor are considered, and the judgment result about whether an aerospace component has the low-dose-rate irradiation damage enhancement effect or not is obtained.

Description

technical field [0001] The invention relates to a method for judging the enhancement effect of low dose rate radiation damage, belonging to the technical field of anti-radiation components. Background technique [0002] Spacecraft operating in a space radiation environment will be affected by space radiation. The total dose radiation effect in space needs to be considered, and the components in the spacecraft need to be evaluated for total dose resistance. However, satellites have been in orbit for at least a few years or more than ten years, and the space radiation dose rate is usually below 0.01rad(Si) / s. The irradiation period is long, and the same length is calculated in years. The ground simulation evaluation test cannot be carried out at the same dose rate as the space on-orbit. Usually, a high dose rate environment is selected to evaluate the ability of the device to withstand low dose rate radiation on orbit. Due to the low dose rate radiation damage enhancement eff...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01N1/44
CPCG01N1/44G01R31/003
Inventor 吕贺李鹏伟孙明张洪伟梅博于庆奎李兴冀杨剑群
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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