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Preparation method of 3D printing negative photoresist for high-precision semiconductor

A negative photoresist and semiconductor technology, which is applied in the field of preparation of 3D printing negative photoresist for high-precision semiconductors, can solve the problem of unsuitable shape and structure of substrates, inability to print and coat smoothly, and photoresist sticking To solve problems such as large degree of precision, achieve the effect of line edge roughness and sensitivity improvement, reduce influence, and increase simplicity

Active Publication Date: 2019-05-21
ZHONGSHAN POLYTECHNIC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, despite such significant advantages, 3D printing photoresists need to have corresponding special properties, among which the ability to print and coat smoothly is the most critical (in order to obtain better coating performance, the main resin needs to have as high a molecular weight as possible; but Molecular weight exceeds a certain level, the photoresist viscosity is too large to print and coat smoothly)
The existing conventional 193nm photoresist has a high viscosity and can only be applied by pulling method, rolling method, centrifugal method, etc., and is basically not suitable for substrates with complex shapes and structures

Method used

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  • Preparation method of 3D printing negative photoresist for high-precision semiconductor
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  • Preparation method of 3D printing negative photoresist for high-precision semiconductor

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Effect test

Embodiment 1

[0045] To prepare 3D printing negative photoresist for high-precision semiconductors, the method is as follows:

[0046] a, 1 part of Ce(NO 3 ) 3 Add 20 parts of methyl orthosilicate to 1000 parts of pure water and stir well, then add 30 parts of aluminum chloride and 5 parts of magnesium chloride and stir well, then add 10 parts of dodecyl dimethyl benzyl bromide Ammonium chloride and fully stirred evenly, heated to 100°C and kept warm for 2 hours, stopped the reaction and discharged, filtered the reaction liquid and fully washed, and then fully dried the filter cake at 60°C to obtain the quaternary ammonium salt organo-modified silicon magnesium aluminum acid;

[0047] b. Add 100 parts of methanol, 1 part of quaternary ammonium salt organically modified magnesium aluminum silicate prepared in step a and 0.5 part of azobisisoheptanonitrile into the reaction kettle, raise the temperature to 70°C, and then add 100 parts of vinyl acetate The ester and 1 part of azobisisobutyr...

Embodiment 2

[0051] To prepare 3D printing negative photoresist for high-precision semiconductors, the method is as follows:

[0052] a. Add 2 copies of Ce 2 (SO 4 ) 3 , 3 copies of Dy(NO 3 ) 3 , 25 parts of ethyl orthosilicate, 25 parts of γ-aminopropyltriethoxysilane are added to 1000 parts of pure water and fully stirred evenly, then 30 parts of aluminum sulfate, 30 parts of aluminum nitrate, 10 parts of magnesium sulfate, 5 parts of magnesium nitrate and stir well, then add 15 parts of cetyl dimethyl benzyl ammonium chloride and 15 parts of octadecyl dimethyl benzyl ammonium bromide and stir well, then heat up to 150°C And keep the reaction for 4 hours, stop the reaction and discharge the material, filter the reaction solution and fully wash it, and then fully dry the filter cake at 90°C to obtain the quaternary ammonium salt organically modified magnesium aluminum silicate;

[0053] b. Add 50 parts of propanol, 50 parts of n-butanol, 5 parts of quaternary ammonium salt organicall...

Embodiment 3

[0057] To prepare 3D printing negative photoresist for high-precision semiconductors, the method is as follows:

[0058] a. Mix 1 part of CeCl 3 , 0.5 Dy 2 (SO 4 ) 3 , 1 part of DyCl 3, 10 parts of methyltriethoxysilane, 10 parts of vinyltriethoxysilane, and 15 parts of γ-(2,3-epoxypropoxy)propyltrimethoxysilane were added to 1000 parts of pure water and fully Stir well, then add 10 parts of aluminum chloride, 15 parts of aluminum sulfate, 10 parts of aluminum nitrate, 2 parts of magnesium chloride, 2 parts of magnesium sulfate, 2 parts of magnesium nitrate and stir well, then add 5 parts of dodecyl dimethyl Benzyl ammonium chloride, 5 parts of hexadecyl dimethyl benzyl ammonium bromide, 5 parts of octadecyl dimethyl benzyl ammonium chloride and stir well, then raise the temperature to 110°C and keep it warm for 3 hours, Stop the reaction and discharge the material, filter the reaction solution and fully wash it, and then fully dry the filter cake at 70°C to obtain a quat...

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Abstract

The invention discloses a preparation method of 3D printing negative photoresist for a high-precision semiconductor. The method comprises the following steps: adopting a rare earth material, a siliconsource, a soluble magnesium salt, a soluble aluminum salt and the like, and preparing modified magnesium aluminium silicate via a high temperature hydrothermal reaction; then causing the modified magnesium aluminium silicate to participate in a polymerization reaction of an acrylate monomer and a crosslinking monomer to prepare a modified acrylic resin oligomer; then preparing a modified thiol solution by using the modified magnesium aluminium silicate; and finally uniformly mixing and dispersing the modified acrylic resin oligomer, the modified thiol solution, a photoinitiator and other auxiliaries. The photoresist prepared by the preparation method disclosed by the invention belongs to a non-chemical amplification type, is rapidly polymerized under a 193 nm deep ultraviolet light source, and has strong photographic performance, good sensitivity and a resolution of 0.09-0.11um, and the photoetching comprehensive performance reaches the international most advanced level, and the application prospect is extremely bright.

Description

【Technical field】 [0001] The invention relates to a preparation method of 3D printing negative photoresist for high-precision semiconductors, which belongs to the technical field of photoresist preparation for semiconductors. 【Background technique】 [0002] Photoresist (photoresist, also known as "photoresist") is a key material required for the photolithography process of manufacturing ultra-large-scale integrated circuits (IC; also known as "semiconductor", commonly known as "chip"). With the development speed of semiconductor Moore's law, it is constantly updated. Photoresist is a high-tech product, which accounts for about 4-5% of the total cost of IC materials. According to the change of photoresist solubility before and after exposure, it can be divided into positive photoresist and negative photoresist. The solubility increases after exposure and development is a positive photoresist, otherwise it is a negative photoresist. Photoresist is the core of photolithograp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F7/038G03F7/004B33Y70/00C08F218/08C08F222/14C08F220/18C08F220/28C08F220/20C08F220/32
Inventor 聂建华王俊李吉昌李金盛江常胜余明君
Owner ZHONGSHAN POLYTECHNIC