Nb/Al multilayer film Laue lens applied to hard X-ray micro-focusing
A multi-layer film and X-ray technology, applied in the research field of precision optical components, can solve problems such as limiting the light intensity at the focal spot
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0023] Adopt the method of the present invention, aim at high-throughput hard X-ray focusing microscopic experiment application, design Nb / Al multilayer film Laue lens, work in E =18keV (λ=0.0666nm), f =22.5mm, dr out =15nm, R max =50μm using a tilted structure:
[0024] (1) Calculate the initial structure of the multilayer Laue lens according to the lens structure formula (1,2), and select the lens inclination angle = 2.2mrad;
[0025] (2) Using the one-dimensional coupled wave theory, calculate the negative first-order diffraction efficiency with depth z changing curve n -1 (z) ;
[0026] (3) According to the diffraction curve n -1 (z) Select the optimal depth z with the greatest efficiency opt =14.60μm;
[0027] (4) According to the optimal depth z opt , calculate the electric field distribution on the exit surface, use the Kirchhoff-Fresnel diffraction integral to obtain the light intensity distribution on the image plane, and obtain the focusing resolution...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com