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Method for measuring coverage rate of quantum dot surface ligand

A technology of surface ligand and measurement method, applied in the field of quantum dots, can solve the problems of affecting the light-emitting layer thin film, uneven quality of the panel, poor uniformity of the quantum dot solution, etc.

Active Publication Date: 2019-06-25
TCL CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the surface coverage of the quantum dots is low, the solubility of the quantum dots is poor, the uniformity of the quantum dot solution is poor, and the drying rate of the quantum dot solution and the coffee ring effect affect the quality of the light-emitting layer film, which directly leads to the quality of the printed panel. Problems such as unevenness, low pixel resolution, turn-on voltage, uneven photoelectric efficiency, etc.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] Determining the Coverage of Phosphorus-Containing Ligands on the Surface of CdZnSe / CdZnSe / ZnSe Quantum Dots

[0038] 1. Determine the average particle size d of CdZnSe / CdZnSe / ZnSe quantum dots. The CdZnSe / CdZnSe / ZnSe quantum dots whose surface ligand is tetradecylphosphoric acid are dissolved in n-hexane solution, and the prepared 5 mg / ml solution is ready to be After the solution is completely dissolved, take a small amount of quantum dot solution and drop 5 drops on the copper grid, and place the carbon grid in a transmission electron microscope analyzer for testing and analysis. Set the accelerating voltage to 200kV, the emission current to 10μA, the working distance to 15 mm, and the dead time to 20%. For magnification analysis of the sample, first set the magnification to 70,000 times, take the area where the quantum dots are concentrated and uniformly dispersed for focusing analysis, and take its TEM picture. To analyze the TEM image, first set the scale length, ...

Embodiment 2

[0046] Determining the Coverage of Phosphorus-Containing Ligands on the Surface of CdZnS / ZnS Quantum Dots

[0047] 1. To determine the average particle size d of CdZnS / ZnS quantum dots, take the CdZnS / ZnS quantum dots whose surface ligands are hexadecyl phosphoric acid and trioctylphosphine and dissolve them in n-hexane solution to prepare a 3 mg / ml solution After the solution is completely dissolved, take a small amount of quantum dot solution and drop 8 drops on the copper grid, and place the carbon grid in a transmission electron microscope analyzer for testing and analysis. Set the accelerating voltage to 300kV, the emission current to 20μA, the working distance to 20 mm, and the dead time to 40%. For magnification analysis of the sample, first set the magnification to 150,000 times, take the area where the quantum dots are concentrated and evenly dispersed for focusing analysis, and take its TEM picture. To analyze the TEM image, first set the scale length, and then take...

Embodiment 3

[0055] Determining the Coverage of Phosphorus-Containing Ligands on the Surface of CdZnS / ZnSe Quantum Dots

[0056] 1. Determine the average particle size d of CdZnS / ZnSe quantum dots. Take the CdZnS / ZnSe quantum dot whose surface ligand is octadecylphosphoric acid and dissolve it in n-hexane solution to prepare a 1 mg / ml solution. After the solution is completely dissolved, take a small amount of quantum dot solution and drop 10 drops on the copper grid. The carbon mesh was placed in a transmission electron microscope analyzer for testing and analysis. Set the accelerating voltage to 300kV, the emission current to 20μA, the working distance to 20 mm, and the dead time to 40%. For magnification analysis of the sample, first set the magnification to 100,000 times, take the area where the quantum dots are concentrated and evenly dispersed for focusing analysis, and take its TEM picture. To analyze the TEM image, first set the scale length, and then take 30-80 quantum dots for ...

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PUM

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Abstract

The invention provides a method for measuring the coverage rate of a quantum dot surface ligand, thereby realizing quality evaluation of quantum dots. If Ki is less than 2*10<-10> mol / cm<2>, the quality of the quantum dot is poor; and solution or ink configuration can not be carried out until the Ki value is improved. With the provided method, the result is accurate; and the operation is simple. Furthermore, with the method, the high stability of the quantum dot surface ligand content is ensured; the solubility of different batches of quantum dots is guaranteed; a coffee ring effect caused bydifferent drying rates in quantum dot solution preparation for a film is avoided; add the pixel resolution and uniformity of the brightening voltage and the photoelectric efficiency of the quantum dotdisplay panel can be improved.

Description

technical field [0001] The invention relates to the technical field of quantum dots, in particular to a method for measuring ligand coverage on the surface of quantum dots. Background technique [0002] Quantum dots refer to semiconductor nanocrystals whose geometric size is smaller than their excitonic Bohr radius. Quantum dots have great potential applications in the fields of biomedicine, environmental energy, and lighting display due to their excellent optical properties such as absorption bandwidth, narrow fluorescence emission band, high quantum efficiency, and good photostability. The display technology based on quantum dot luminescence has been highly valued by the display industry in recent years. Compared with liquid crystal display and organic light-emitting display, quantum dot luminescence has a wider color gamut, higher color purity, simpler structure, and higher stability. It is considered It is a new generation display technology. [0003] The preparation t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N24/08
CPCY02E10/549
Inventor 覃辉军叶炜浩杨一行
Owner TCL CORPORATION
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