A kind of preparation method of tantalum doped hafnium dioxide ferroelectric material
A technology of hafnium dioxide and ferroelectric materials, applied in the field of materials, can solve the problems that the mechanism of ferroelectricity in thin films is unclear and elements have not been studied
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[0017] The present invention will be further elaborated below in conjunction with the accompanying drawings and embodiments.
[0018] Taking a ferroelectric HfO2 film with a film thickness of 20 nm and a tantalum content of 15.8 mol.% as an example, the specific steps in the present invention will be described in detail.
[0019] The specific steps are attached figure 1 As shown, here we describe this process in detail:
[0020] Step 1: Growth of 20nm Ta-doped HfO on Pt / Si substrate by pulsed laser deposition (PLD) 2 film. Specifically:
[0021] Place the Pt substrate above the target in the vacuum chamber, the distance between the target and the substrate is fixed at 55mm, and the temperature of the substrate is raised to 150°C;
[0022] After the heating is completed, 99.999% oxygen is introduced, and the oxygen pressure is controlled at 1Pa. The laser (KrF) with a wavelength of 248nm is used to ablate the surface of the rotating target, and the laser energy is 2.5J / cm ...
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