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A kind of preparation method of inp film with distributed Bragg reflector

A Bragg Mirror, Thin Film Technology

Active Publication Date: 2021-04-23
西安海川华腾科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, its high cost, narrow band gap and low luminous efficiency restrict its application in wider fields (such as: flexible display, wearable devices, etc.)

Method used

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  • A kind of preparation method of inp film with distributed Bragg reflector
  • A kind of preparation method of inp film with distributed Bragg reflector
  • A kind of preparation method of inp film with distributed Bragg reflector

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preparation example Construction

[0030] The present invention is a kind of preparation method of InP thin film with distributed Bragg reflector, comprises the following steps:

[0031] Step 1. In the electrolyte, the InP sheet is electrochemically etched to make porous InP, and then the voltage is increased to prepare a peeled large-area porous InP film;

[0032] Wherein the electrolyte is any one of the aqueous solutions of oxalic acid, nitric acid or hydrochloric acid, and the concentration of the electrolyte is 0.2-0.8mol / L;

[0033] The etching voltage of electrochemical etching is 1-10V, and the etching rate is 1-3μm / min;

[0034] The thickness of the InP sheet is 300-500μm, and the doping concentration is 1.0×10 18 ~4×10 18 cm -3 ;

[0035] Step 2. Perform electrochemical etching on the n-GaN / u-GaN periodic structure in the electrolyte to obtain a distributed Bragg reflector (DBR);

[0036] Wherein the electrolyte is any one of aqueous solutions of hydrofluoric acid, oxalic acid or nitric acid, and...

Embodiment 1

[0042] Step 1. Prepare 0.4mol / L nitric acid acid solution with deionized water; as the electrolyte, turn on the etching equipment, and set the etching voltage to 7V; use the platinum wire as the cathode, and the InP sheet as the anode, at a constant voltage Etching for 10 minutes; the etching rate of the InP sheet is 1-3 μm / min, and after the etching is completed, a porous InP film is formed; as shown in FIG. 1 . Then the voltage was increased to 15V, and a peeled InP film was obtained.

[0043] Step 2. Prepare 0.2mol / L oxalic acid acid solution with deionized water; as the electrolyte, turn on the etching equipment, and set the etching voltage to 20V; use platinum wire as the cathode, and n-GaN / u-GaN The periodic structure is the anode, etched at constant pressure for 30 minutes; the thickness of the u-GaN layer is 80nm, and the doping concentration is 1.0×10 15 cm -3 , the thickness of the n-GaN layer is 60nm, and the doping concentration is 1×10 19 cm -3 . The etching ...

Embodiment 2

[0047] Step 1. Use deionized water to prepare 0.4mol / L oxalic acid acidic solution; as the electrolyte, turn on the etching equipment, and set the etching voltage to 9V; use platinum wire as the cathode, and InP sheet as the anode, constant voltage Etching for 15 minutes; the etching rate of the InP sheet is 1-2 μm / min. After the etching is completed, a porous InP film is formed; then the voltage is increased to 20V to obtain a stripped InP film.

[0048] Step 2. Prepare 0.5mol / L hydrofluoric acid acidic solution with deionized water; as the electrolyte, turn on the etching equipment, and set the etching voltage to 18V; use platinum wire as the cathode, and use n-GaN / u -The GaN periodic structure is the anode, etched at constant pressure for 25 minutes; the etching rate of the n-GaN / u-GaN periodic structure is 20-80nm / min, after the etching is completed, turn off the etching equipment; soak the anode sample in After 10 minutes in deionized water, dry it with nitrogen gas to ob...

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Abstract

The invention discloses a method for preparing an InP thin film with a distributed Bragg reflector, which specifically includes the following steps: Step 1. In an electrolyte, electrochemically etch an InP sheet to prepare a porous InP, and then increase the voltage, Prepare a large-area porous InP film that has been peeled off; step 2, in the electrolyte, carry out electrochemical etching to the n-GaN / u-GaN periodic structure, and make a distributed Bragg reflector; step 3, transfer the obtained The porous InP film is transferred to the distributed Bragg reflector substrate described in step 2, and finally a large-area InP film with a distributed Bragg reflector is prepared. Its photoluminescence peak position can be adjusted to 541.2nm, and the luminous intensity is 2-4 times higher than that of the porous InP before transfer.

Description

technical field [0001] The invention belongs to the technical field of semiconductor optoelectronic material preparation methods, and in particular relates to a preparation method of an InP thin film with a distributed Bragg reflector. Background technique [0002] Indium phosphide (InP) has been widely used in the fields of electronic devices and optoelectronic devices. However, its high cost, narrow bandgap, and low luminous efficiency restrict its application in wider fields (such as: flexible displays, wearable devices, etc.). In order to overcome the above problems, the etching and lift-off technique can be used to prepare the peeled porous InP film and transfer it to the distributed Bragg reflector (DBR) substrate. The luminescence peak position can be modulated to 541.2nm, and the luminous intensity Porous InP before transfer is improved by 2-4 times. At present, the position of the luminescence peak of the prepared porous InP is mostly at 915nm. The process mainly ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/00H01L33/10
CPCH01L33/10H01L33/0093
Inventor 曹得重
Owner 西安海川华腾科技有限公司