In situ exafs characterization method for crystallization kinetics of amorphous alloys

A kinetic characteristic, amorphous alloy technology, applied in the field of in-situ EXAFS characterization of amorphous alloy crystallization kinetic characteristics, and the characterization of amorphous alloy nanocrystalline characteristics, can solve the problem of inability to analyze the microscopic crystallization mechanism and Atomic Migration and Diffusion Laws and other issues

Active Publication Date: 2022-02-25
SHANDONG JIANZHU UNIV
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Problems solved by technology

[0007] The technical problem to be solved by the present invention is to change the traditional method of analyzing the crystallization dynamics characteristics of amorphous alloys through thermal performance testing, and solve the problem that the traditional thermal analysis method cannot analyze the microscopic crystallization mechanism and atomic migration and diffusion law in the crystallization process , through the combination of absorption spectrum analysis technology and numerical simulation, the atomic migration and diffusion process, the formation and growth mechanism of crystal nuclei, and the crystallization kinetics characteristics during the nanocrystallization process of amorphous alloys are obtained, so as to characterize amorphous alloys nanocrystallization process

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  • In situ exafs characterization method for crystallization kinetics of amorphous alloys
  • In situ exafs characterization method for crystallization kinetics of amorphous alloys
  • In situ exafs characterization method for crystallization kinetics of amorphous alloys

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Embodiment

[0026] The test adopts the atomic percentage as Zr 48 Cu 36 Al 8 Ag 8 amorphous alloys.

[0027] a. Select the nominal composition as Zr 48 Cu 36 Al 8 Ag 8 (at.%) amorphous alloy as the object, through vacuum arc melting (repeated smelting 5 times) and vacuum stripping to obtain a 5 × 400mm bulk amorphous alloy, cutting and thinning it into a thin sheet alloy of 3mm × 3μm sample;

[0028] b. Place the sample in the optical path of synchrotron radiation (wavelength 0.01nm) for in-situ isothermal crystallization, the processing temperature is 470°C, and the radiation data collection frequency is 6min, to obtain the EXAFS absorption line I of the alloy M (2θ), see appendix figure 1 , each data point in the figure comes from the experimental data of annealing every 6 minutes;

[0029] c. Correct and convert the obtained absorption spectrum data to obtain the interference function I(Q) of the alloy, and perform Fourier transformation to obtain the reduced radial distribut...

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Abstract

An in-situ EXAFS characterization method for the crystallization kinetics of amorphous alloys belongs to the field of nanocrystalline material preparation technology. It uses Fourier transform and structural function derivation, and uses a specific JMA equation for segmental fitting to analyze crystals. Kinetics, making the analysis more accurate and reliable.

Description

technical field [0001] The invention belongs to the technical field of preparation of nanocrystalline materials and the technical field of amorphous alloys, and relates to a technical method for characterizing nanocrystallization characteristics of amorphous alloys, in particular to an in-situ EXAFS characterization method for crystallization kinetic characteristics of amorphous alloys. Background technique [0002] Amorphous alloys are a new generation of metal materials with long-range disorder and short-range order structures. They have a series of excellent mechanical, physical and chemical properties that cannot be compared with traditional crystalline metal materials, such as high strength, high hardness, and extremely low temperature at room temperature. Large elastic limit and good formability in viscous state, etc., have broad application prospects in the fields of machinery, communication, automobile industry, aerospace and other fields, and become a major research ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/085
CPCG01N23/085G01N2223/041G01N2223/1016G01N2223/602
Inventor 徐勇徐丽丽张东明杨凌飞商雨新叶佳硕刘梓龙孔俊杰李从腾石磊
Owner SHANDONG JIANZHU UNIV
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