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Method and system for grading and screening microscopic particles by novel array vortex light beam

A vortex beam, graded screening technology, applied in the manipulation of neutral particles by radiation pressure, radiation/particle processing, nuclear engineering, etc., can solve the problem of complex optical system, expensive optical components and instruments, and can not be portable And other issues

Active Publication Date: 2020-04-17
UNIV OF SHANGHAI FOR SCI & TECH +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The single optical tweezers technology has been widely used, but it can only realize the manipulation of a single particle, and the flexibility is not high. The array optical tweezers can manipulate multiple particles at the same time, realizing the diversification of manipulation. The optical vortex composed of vortex beams The vortex array can efficiently carry out large-scale molecular screening, and can capture and observe multiple particles at the same time. Compared with a single vortex, it can greatly improve the work efficiency and meet the application requirements of capturing, manipulating and observing multiple or even a large number of particles.
At present, the methods for generating optical vortex arrays include plane wave interferometry, spatial light modulation, optical contract diffraction, etc., but these methods have the following problems: the optical system is complex, the required optical components or instruments are expensive, or they need to be modulated by a computer , cannot be portable

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  • Method and system for grading and screening microscopic particles by novel array vortex light beam
  • Method and system for grading and screening microscopic particles by novel array vortex light beam
  • Method and system for grading and screening microscopic particles by novel array vortex light beam

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Embodiment Construction

[0043] The technical solution adopted by the present invention will be further described below in combination with schematic diagrams.

[0044] The first embodiment of the present invention provides a system for classifying and screening microscopic particles by a novel array vortex beam (hereinafter referred to as "the system"), see figure 1 , which includes a laser 1 , a uniform plate 2 , a collimating beam expander lens group 3 , an aperture array plate 4 , an SPP array plate 5 , a lens array 6 , and a microfluidic chamber 7 arranged in sequence from top to bottom.

[0045] figure 2 It is a schematic diagram of the SPP array board, as can be seen in the figure, the SPP array board (SPP MxL ) The height of each column SPP satisfies h 1 >h 2 >h 3 >... h L , that is, the height of the SPP gradually decreases with the number of columns arranged. When making the SPP array plate, the diameter of each SPP of M×L is d L , and the aperture diameter d K Both satisfy the relat...

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Abstract

The invention provides a method and a system for grading and screening microscopic particles by using a novel array vortex light beam. According to the system, a laser beam generated by a laser passesthrough a light homogenizing plate to obtain a uniform equal-intensity light beam; the uniform light beams are collimated and expanded through a lens group; the expanded uniform light beams are vertically incident to a light hole array plate, an equal-intensity uniform light array is obtained; the equal-intensity uniform light array emitted through the light hole is incident to an array plate which is arranged into M rows and L columns by a spiral phase plate; the height of each column of SPP is set in a differentiated mode, emergent vortex light arrays with different topological charge values at different column positions are obtained, finally the emergent vortex light arrays are focused on a far field through a lens array, a Fraunhofer diffraction field of a focusing vortex light beam array is obtained, and a microfluid chamber is placed in the Fraunhofer diffraction field range of the focusing vortex light beam array. As the vortex light beams at each column position have differenttopological charges, microscopic particles in the microfluid chamber can be classified and screened according to the difference of light field forces of the vortex light beams.

Description

technical field [0001] The invention relates to a method and system for classifying and screening microscopic particles by a novel array vortex beam, which can be used for simultaneously capturing and classifying a plurality of microscopic particles. Background technique [0002] The vortex beam is also called "dark hollow beam". It is a non-uniform beam with a gradient distribution of light intensity. For the pulling force, the particles are trapped near the focal point of light, that is, a potential well of bound particles is formed near the focal point, which is vividly called optical trap or optical tweezers. Due to the advantages of high confinement force, low optical damage and spin and orbital angular momentum, the focused dark hollow beam is used as "optical tweezers" and "optical wrench" to control microscopic particles such as soft organisms. Cells are imprisoned and manipulated to avoid damage to biological cells. [0003] Spiral phase plate (SPP, SpiraL Phase P...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G21K1/00
CPCG21K1/006
Inventor 张大伟石冰果王凯民刘博戴博张雷洪张琦徐美勇忻向军
Owner UNIV OF SHANGHAI FOR SCI & TECH