Methods and apparatus for controlling contaminant deposition on dynode electron-emmissive surface

A technology of dynode and electron emission, applied in the direction of dynode, cleaning method and appliance, electron multiplier dynode, etc.
CN111466010AInactive Publication Date: 2020-07-28艾德特斯解决方案有限公司
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
艾德特斯解决方案有限公司
Publication Date
2020-07-28
Estimated Expiration
Not applicable · inactive patent

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Abstract

The present invention relates to generally to components of scientific analytical equipment, and particularly to methods for extending the operational lifetime or otherwise improving the performance of dynodes used in electron multipliers. An aspect of the invention is embodied in a method for: (i) increasing the secondary electron yield of a dynode and / or (ii) decreasing the rate of degradation of electron yield of a dynode, the method comprising the step of exposing a dynode electron-emissive surface to an electron flux under conditions causing electron-impact induced removal of a contaminant deposited on the dynode electron-emissive surface. The conditions may be selected such that the electron-mediated removal is enhanced relative to a contaminant deposition process so as to provide anet decrease in the rate of contaminant deposition and / or a decrease in the amount of contaminant present on the dynode electron-emissive surface.
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Description

technical field

[0001] The present invention generally relates to components of scientific analysis equipment. More particularly, the present invention relates to methods for extending the operating life or otherwise improving the performance of dynodes used in electron multipliers. Background technique

[0002] Amplifying electronic signals is necessary in many scientific applications. For example, in a mass spectrometer, analytes are ionized to form a series of charged particles (ions). The resulting ions are then separated according to their mass-to-charge ratios, typically by acceleration and exposure to electric or magnetic fields. The separated signal ions strike the ion detector surface to generate one or more secondary electrons. Results are shown as spectra of relative abundance of detected ions as a function of mass-to-charge ratio.

[0003] In other applications, the particles to be detected may not be ions, but may be neutral atoms, neutral molecules or ele...

Claims

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