High depth-to-width ratio superconducting niobium nitride nano wire as well as preparation method and application thereof
A niobium nitride nanometer, high aspect ratio technology, applied in chemical instruments and methods, manufacturing/processing of superconductor devices, nanotechnology, etc., can solve the problem of less applied research
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Embodiment 1
[0053] In this embodiment, a high aspect ratio superconducting niobium nitride nanowire is prepared, the depth of which is 100nm, the aspect ratio is greater than 1:1, and the line width / space (L / S) is 80nm / 80nm.
[0054] The preparation method of the nanowire specifically includes the following steps:
[0055] (1) Using DC magnetron sputtering process to polish Si on both sides 3 N 4 / Si / Si 3 N 4 A NbN thin film was grown on the substrate at a sputtering rate of 1.25nm / s for 80s to prepare a 100nm thick NbN thin film; the magnetron sputtering system model was DE500 from Texas Instruments.
[0056] The room temperature sheet resistance of the prepared 100nm thick NbN thin film was measured by the four-probe method to be 23.6Ω. The superconducting transition temperature Tc was measured in a liquid helium Dewar to be 11.2K, and the superconducting transition width ΔT was 0.24K. NbN thin film superconducting transition temperature figure 2 shown.
[0057] (2) Prepare a nan...
Embodiment 2
[0071] In this embodiment, a high aspect ratio superconducting niobium nitride nanowire is prepared, the depth of which is 100nm, the aspect ratio is equal to 1:1, and the line width / space (L / S) is 100nm / 100nm.
[0072] The preparation method of the present embodiment comprises the steps:
[0073] (1) in Si 3 N 4 / Si / Si 3 N 4 Growth thickness is 100nm thick NbN thin film on the substrate, preparation method is the same as embodiment 1;
[0074] (2) Prepare the nanowire structure with the target line width / space (L / S) of 100nm / 100nm, and the L / S of the designed pattern is 150nm / 50nm.
[0075] (3) Spin coating on the surface of the NbN film by positive electron beam resist AR-P 6200.13, the preparation method is the same as in Example 1;
[0076] (4) Through the electron beam exposure system EBPG5200 with the highest accelerating voltage of 100kV, perform 4 scanning exposures, the exposure beam current is 100pA, and the exposure dose is set to 90μC / cm 2, 85μC / cm 2 、90μC / c...
Embodiment 3
[0085] In this embodiment, a high aspect ratio superconducting niobium nitride nanowire is prepared, the depth of which is 100nm, the aspect ratio is greater than 1:1, and the line width / space (L / S) is 80nm / 80nm.
[0086] The preparation method of the nanowire specifically includes the following steps:
[0087] (1) in Si 3 N 4 / Si / Si 3 N 4 Growth thickness is 100nm thick NbN thin film on the substrate, preparation method is the same as embodiment 1;
[0088] (2) Prepare a nanowire structure with a target line width / space (L / S) of 80nm / 80nm, and the L / S of the designed pattern is 120nm / 40nm.
[0089] (3) Spin coating on the surface of the NbN film by positive electron beam resist AR-P 6200.13, the preparation method is the same as in Example 1;
[0090] (4) Through the electron beam exposure system EBPG5200 with the highest accelerating voltage of 100kV, perform 4 scanning exposures, the exposure beam current is 100pA, use 4 scanning exposures, and the exposure dose is set...
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