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A circuit-level high-power microwave backdoor coupling real-time testing device and method

A high-power microwave and real-time testing technology, which is applied in the direction of electronic circuit testing, measuring devices, and measuring electronics, can solve the problems of inability to realize circuit-level online testing and real-time monitoring of coupled electrical signals at key nodes of the circuit, so as to improve online testing. Accuracy, ensuring validity, and reducing the effect of test error

Active Publication Date: 2022-07-01
INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the various deficiencies of the existing technology, in order to solve the above problems, a circuit-level high-power microwave backdoor coupling real-time test device and method are proposed to solve the problem that the circuit-level online test and real-time monitoring cannot be realized in the current high-power microwave backdoor coupling research. The Problem of Coupling Electrical Signals at Key Nodes of Circuits

Method used

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  • A circuit-level high-power microwave backdoor coupling real-time testing device and method
  • A circuit-level high-power microwave backdoor coupling real-time testing device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0053] like figure 1 As shown, a circuit-level high-power microwave backdoor coupling real-time test device includes an HPM irradiation environment generation module, an effector placement platform, a test probe assembly and a test signal processing unit. Wherein, the effector placement platform and the test probe assembly are located in the microwave anechoic chamber 19 , and the HPM irradiation environment generation module and the test signal processing unit are located in the electromagnetic shielding room 18 .

[0054] The HPM irradiation environment generation module is used to generate HPM radiation fields with set parameters, and includes a high-power signal source 1 and a radiation antenna 2 , and the radiation antenna 2 has a transmitting end placed in a microwave anechoic chamber 19 .

[0055] The effector placement platform is used to fix the effector and adjust the effector state, which includes a test platform 3 , an effector fixing unit 6 , and an effector state...

Embodiment 2

[0065] like figure 1 and figure 2 As shown, a method for a circuit-level high-power microwave backdoor coupling a real-time test device includes the following steps:

[0066] S1: Use the HPM irradiation environment generation module to generate the HPM radiation field with set parameters, irradiate the effector placed in the specified state of the effector placement platform, and obtain the effect phenomenon and threshold. The setting parameters of the HPM radiation field include: Peak power, pulse width, repetition frequency, launch time, polarization direction.

[0067] The acquisition methods of effect phenomenon and threshold value are: monitoring and observing the effect phenomenon when the effector acts through the video module, using the effector supporting remote parameter acquisition equipment to monitor the effector function and state indicators, using the effector after irradiation, and effector testing. Post-damage detection and evaluation, microwave monitoring ...

Embodiment 3

[0078] The same parts of this embodiment as those of Embodiment 1 and Embodiment 2 will not be repeated, except that:

[0079] The HPM radiation environment generation module includes an S-band high-power narrow-band microwave signal source with an operating frequency of 2.88GHz, a BJ26 waveguide, and an open horn antenna with a BJ26 interface. The open horn antenna of the BJ26 interface is placed in a microwave anechoic chamber. The S-band high-power narrow-band microwave signal source placed outside the microwave anechoic chamber 19 is connected. At the same time, the 2.88GHz S-band high-power narrow-band microwave signal source can generate pulsed microwave signals with peak power greater than 1MW.

[0080] Correspondingly, the HPM radiation field test module includes a wideband antenna with a test frequency range of 1-18GHz, an insulating antenna bracket, a 20m shielded coaxial cable, a 0-60dB adjustable attenuator, a detector with a working range of 0-4GHz, and a bandwidt...

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Abstract

The invention relates to a circuit-level high-power microwave backdoor coupling real-time testing device and method, belonging to the technical field of high-power microwave testing. The circuit-level high-power microwave backdoor coupling real-time testing device comprises an HPM irradiation environment generation module and an effector placement platform , a test probe assembly and a test signal processing unit, wherein the effector placement platform and the test probe assembly are located in a microwave anechoic chamber, the HPM irradiation environment generation module and the test signal processing unit are located in the electromagnetic shielding room, the present invention is in the microwave anechoic chamber. Real-time circuit-level on-line testing of effectors in the darkroom, real-time monitoring of coupled electrical signals at key circuit nodes, and at the same time, circuit-level on-line testing of HPM radiation fields with various setting parameters and states of various effectors, customized tests for different measurement requirements Probe components to meet the testing needs of multi-scale, multi-band, and various electrical signals.

Description

technical field [0001] The invention belongs to the technical field of high-power microwave testing, and in particular relates to a circuit-level high-power microwave backdoor coupling real-time testing device and method. Background technique [0002] With the rapid development of electronic information technology, the circuit integration of electronic equipment is getting higher and higher, and the core circuit of the equipment is affected by the external electromagnetic environment during the working process. Accidents occur frequently, especially in recent years, the widespread use of intelligent unmanned technology The risk of economic and casualty losses caused by this type of accident is increasing day by day. [0003] High-power microwave (HPM) pulse impact is one of the important potential factors that lead to the failure of core circuit functions of electronic products and equipment. Therefore, research on high-power microwave effects is carried out to analyze the m...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/08G01R35/00G01R31/28
CPCG01R29/0821G01R29/0892G01R35/005G01R31/2849
Inventor 冯溪溪袁欢戈弋刘忠赵刚陈朝阳赵景涛陈自东
Owner INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS