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Ion implantation thin film wafer stripping method, single crystal thin film and electronic component

An ion implantation, single crystal thin film technology, used in electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as chip explosion and strong force

Pending Publication Date: 2021-02-19
JINAN JINGZHENG ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] This application provides a method for stripping ion-implanted thin film wafers, single crystal thin films and electronic components to solve the problem that in the prior art, when the remaining mass layer is separated from the whole thin film layer instantly, a very strong force will be generated, causing the Wafer Burst Problem

Method used

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  • Ion implantation thin film wafer stripping method, single crystal thin film and electronic component
  • Ion implantation thin film wafer stripping method, single crystal thin film and electronic component
  • Ion implantation thin film wafer stripping method, single crystal thin film and electronic component

Examples

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Embodiment 1

[0110] 1) Prepare a single crystal silicon substrate wafer with a size of 4 inches, a thickness of 0.5 mm and a smooth surface. After cleaning the silicon substrate wafer, prepare a thickness on the surface of the single crystal silicon substrate wafer by thermal oxidation A silicon dioxide layer of 2 μm, wherein the surface roughness of the silicon dioxide is less than 0.5 nm.

[0111] 2) Prepare a 4-inch lithium niobate wafer, clean the lithium niobate wafer, and inject helium ions (He + ) into lithium niobate wafers, the implantation energy of helium ions is 200KeV, and the dose is 4×10 16 ions / cm 2 , forming a lithium niobate wafer with a three-layer structure of a thin film layer, a separation layer and a residue layer.

[0112] 3) Bond the thin film layer of the ion-implanted lithium niobate wafer with the silicon dioxide layer of the silicon substrate wafer by plasma bonding to form a bonded body; then put the bonded body into the heating device Keep warm at 100°C fo...

Embodiment 2

[0117] 1) Prepare a single crystal silicon substrate wafer with a size of 4 inches, a thickness of 0.5 mm and a smooth surface. After cleaning the silicon substrate wafer, prepare a thickness on the surface of the single crystal silicon substrate wafer by thermal oxidation A silicon dioxide layer of 2 μm, wherein the surface roughness of the silicon dioxide is less than 0.5 nm.

[0118] 2) Prepare a 4-inch lithium niobate wafer, clean the lithium niobate wafer, and inject helium ions (He + ) into lithium niobate wafers, the implantation energy of helium ions is 200KeV, and the dose is 4×10 16 ions / cm 2 , forming a lithium niobate wafer with a three-layer structure of a thin film layer, a separation layer and a residue layer.

[0119] 3) Bond the thin film layer of the ion-implanted lithium niobate wafer with the silicon dioxide layer of the silicon substrate wafer by plasma bonding to form a bonded body; then put the bonded body into the heating device Keep warm at 100°C fo...

Embodiment 3

[0124] 1) Prepare a single crystal silicon substrate wafer with a size of 4 inches, a thickness of 0.5 mm and a smooth surface. After cleaning the silicon substrate wafer, prepare a thickness on the surface of the single crystal silicon substrate wafer by thermal oxidation A silicon dioxide layer of 2 μm, wherein the surface roughness of the silicon dioxide is less than 0.5 nm.

[0125] 2) Prepare a 4-inch lithium niobate wafer, clean the lithium niobate wafer, and inject helium ions (He + ) into lithium niobate wafers, the implantation energy of helium ions is 200KeV, and the dose is 4×10 16 ions / cm 2 , forming a lithium niobate wafer with a three-layer structure of a thin film layer, a separation layer and a residue layer.

[0126] 3) Bond the thin film layer of the ion-implanted lithium niobate wafer with the silicon dioxide layer of the silicon substrate wafer by plasma bonding to form a bonded body; then put the bonded body into the heating device Keep warm at 200°C fo...

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Abstract

The embodiment of the invention provides an ion implantation thin film wafer stripping method, a single crystal thin film and an electronic component, and the method comprises the steps: preparing a substrate wafer; preparing a thin film wafer after ion implantation, wherein the thin film wafer after ion implantation is a thin film wafer with a thin film layer, a separation layer and a remainder layer; bonding the thin film layer of the thin film wafer with the substrate wafer to form a bonded body; and gradually heating the bonding body to realize gradual separation of the film layer and theremainder layer. By adopting the scheme, the bonding body is heated step by step, so that the residual layer and the thin film layer are separated step by step, and the problem that the wafer is exploded due to acting force generated by integral separation of the residual layer and the thin film layer is avoided.

Description

technical field [0001] The present application relates to the technical field of semiconductors, in particular to a method for stripping ion-implanted thin film wafers, single crystal thin films and electronic components. Background technique [0002] Lithium niobate / lithium tantalate single crystal thin films prepared with silicon materials as substrates have a wide range of applications in the fields of acoustic wave devices, optical signal processing, information storage and electronic devices, and can be used to make filters and optical waveguide modulators , optical waveguide switches, spatial light modulators, optical frequency multipliers, surface acoustic wave generators, infrared detectors and ferroelectric memories, etc., have broad application prospects. [0003] The existing preparation process of lithium niobate / lithium tantalate single crystal thin film usually adopts the ion implantation method to obtain a lithium niobate / lithium tantalate single crystal wafer...

Claims

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Application Information

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IPC IPC(8): H01L21/265H01L21/02
CPCH01L21/265H01L21/02002
Inventor 刘桂银张秀全刘阿龙连坤
Owner JINAN JINGZHENG ELECTRONICS