Micro-focusing synchrotron radiation small-angle scattering and polarizing microscope system combined device

Abstract

The invention provides a micro-focusing synchrotron radiation small-angle scattering and polarizing microscope system combined device. The device comprises a micro-focusing part and an in-situ polarizing microscope system which are sequentially arranged on a first optical axis, wherein the micro-focusing part comprises a composite refraction lens; the in-situ polarizing microscopic system comprises a detector, an optical lens group, a plane mirror and a sample table, wherein the detector, the optical lens group and the plane mirror are sequentially arranged on a second optical axis perpendicular to a first optical axis; the plane mirror is positioned at the intersection of the first optical axis and the second optical axis; the sample table is positioned on the first optical axis and at the downstream of the plane mirror; and the visible light reflection light source is arranged on the third optical axis and is opposite to the optical lens group. According to the combined device disclosed by the invention, the polarizing microscopic system is combined with the micro-focusing small-angle scattered beam line, so the real morphology of a sample crystal can be observed in real time, the center of a field of view of polarizing microscopic imaging is overlapped with X-rays at a sample through the arrangement of the plane mirror, and the combined device can be used for positioning the real-time position of the X-rays which cannot be observed.

Description

technical field [0001] The invention belongs to the field of material microstructure characterization, and in particular relates to a micro-focus synchrotron radiation small-angle scattering and polarizing microsystem combined device. Background technique [0002] Due to the characteristic of long-chain structure, polymers have obvious multi-scale structures after crystallization and solidification, that is, from angstrom-level molecular chain units and conformations to nano-scale lamellar crystals to micron-scale spherulite structures. Synchrotron small-angle X-ray scattering (Small angle X-ray scattering, SAXS), as a non-destructive, highly statistically averaged structure analysis method, is increasingly used in the study of the structure of crystalline polymer materials, such as through Guinier scattering Study the crystal grains in crystalline polymers, the micro-domains in blended polymers (including dispersed phase and continuous phase), the shape, size and distributi...

AI Technical Summary

Problems solved by technology

[0003] The existing synchrotron small-angle X-ray scattering (SAXS) has the following disadvantages: First, the spot size is large, and it is impossible to distinguish the micro-regions inside the polymer spherulites, and can only obtain the statistical average information of the inhomogeneous structure of the spherulites. Understanding the structure-property relationship of spherulite domains in crystalline polymer materials poses a great obstacle

Second, during the synchrotron radiation experiment, it is impossible to observe the crystal morphology of the experimental sample in real time, so that it is impossible to confirm the specific part of the X-ray incident polymer crystal, which increases the uncertainty of the correspondence between the detection result and the real structure.

[0006] However, there is no report on the combination of coaxial polarizing microscope and micro-focusing SAXS device, so how to set up the specific structure of the device so that the coaxial polarizing microscope and micro-focusing SAXS device can be used together is still unclear

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