Magnetic ellipsometry device
A measuring device and ellipsometry technology, which is applied in the directions of measuring device, magnetic property measurement, polarization influence characteristics, etc., can solve the problems of limited information acquisition, inability to obtain richer information on the magneto-optical properties of magnetic samples, and inability to realize the magneto-optical properties of materials. Measurement and other issues, to achieve the effect of a single influencing factor, rich functions, and easy expansion
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0031] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0032] see figure 1 and figure 2 , the present invention provides a magneto-optical ellipsometry device, which includes an ellipsometry module 100 , a magnetic field loading module 200 and a sample stage 300 . Among them, the magnetic field loading module 200 can apply transverse magnetic field loading, vertical magnetic field loading, arbitrary horizontal azimuth magnetic field loading and p...
PUM
Property | Measurement | Unit |
---|---|---|
wavelength | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com