Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Magnetic ellipsometry device

A measuring device and ellipsometry technology, which is applied in the directions of measuring device, magnetic property measurement, polarization influence characteristics, etc., can solve the problems of limited information acquisition, inability to obtain richer information on the magneto-optical properties of magnetic samples, and inability to realize the magneto-optical properties of materials. Measurement and other issues, to achieve the effect of a single influencing factor, rich functions, and easy expansion

Active Publication Date: 2021-08-27
HUAZHONG UNIV OF SCI & TECH
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above devices are important instruments for the study of magnetic phenomena. However, these instruments can only measure some magneto-optical properties, such as magnetic moment, etc., and cannot obtain richer information related to the magneto-optical properties of magnetic samples.
However, when the magnetic field loading device is integrated on the basis of the ellipsometry method, the characterization of the magneto-optical Kerr effect and the magneto-optic Faraday effect can be realized, but these methods cannot realize the measurement of the magneto-optical properties of materials under any magnetic field orientation and any magnetic field strength. , and the information obtained is relatively limited

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Magnetic ellipsometry device
  • Magnetic ellipsometry device
  • Magnetic ellipsometry device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0032] see figure 1 and figure 2 , the present invention provides a magneto-optical ellipsometry device, which includes an ellipsometry module 100 , a magnetic field loading module 200 and a sample stage 300 . Among them, the magnetic field loading module 200 can apply transverse magnetic field loading, vertical magnetic field loading, arbitrary horizontal azimuth magnetic field loading and p...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
wavelengthaaaaaaaaaa
Login to View More

Abstract

The invention belongs to the related technical field of optical measurement, and discloses a magnetic ellipsometry device which comprises an ellipsometry module, a magnetic field loading module and a sample table, the ellipsometry module is used for performing optical measurement on a sample, and the magnetic field loading module comprises a horizontal magnetic field loading module and a vertical magnetic field loading module, the horizontal magnetic field loading module comprises a horizontal moving assembly, a first permanent magnet magnetic pole pair and a rotating table, the rotating table is used for driving the horizontal moving assembly to rotate in a horizontal plane, and the horizontal moving assembly is used for enabling two magnets in the first permanent magnet magnetic pole pair to move face to face or back to back; the vertical magnetic field loading module comprises a vertical moving assembly and a second permanent magnet pole pair, and the vertical moving assembly enables two magnets of the second permanent magnet pole pair to move face to face or back to back relative to the sample table. According to the invention, ellipsometry parameter and Mueller matrix measurement can be carried out on to-be-measured samples under different magnetic field intensities and different modes of magnetic fields.

Description

technical field [0001] The invention belongs to the technical field related to optical measurement, and more specifically relates to a magnetic ellipsometry device. Background technique [0002] When there is an external magnetic field loading, the magnetization intensity, magnetization direction, magnetization coupling coefficient and dielectric tensor of the magnetic material will change, so that the optical properties of the magnetic material will change. The physical phenomenon is often referred to as the magneto-optical effect. At present, magnetic devices such as magneto-optical storage, magneto-optic isolation, magneto-optic switch, magneto-optic modulation, spintronics, and magnetic sensing have been developed by using the magneto-optical effect characteristics of magnetic materials, and are widely used in semiconductors, energy, medical and Defense technology and other fields. A deep knowledge and thorough understanding of the magneto-optical properties of magneti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/21G01N21/01G01R33/12
CPCG01N21/211G01N21/01G01R33/12G01N2021/218
Inventor 刘世元刘佳敏江浩龚雯棋
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products