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Microwave photon frequency measuring device and method based on fixed low-frequency detection

A microwave photon and frequency measurement technology, applied in frequency measurement devices, measurement devices, measurement of electrical variables, etc., can solve the problems of complex structure, high cost, and high requirements for laser wavelength stability.

Pending Publication Date: 2021-09-14
CHONGQING UNIV OF POSTS & TELECOMM
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  • Summary
  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

However, the measured microwave frequency range is affected by the bandwidth of the microwave mixer, and an auxiliary local oscillator microwave source and two electro-optic phase modulators are required, which has a complex structure. In addition, an optical filter with a specific frequency response needs to be constructed, and at the same time The stability of the laser wavelength is high and the cost is high

Method used

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  • Microwave photon frequency measuring device and method based on fixed low-frequency detection
  • Microwave photon frequency measuring device and method based on fixed low-frequency detection
  • Microwave photon frequency measuring device and method based on fixed low-frequency detection

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Embodiment

[0050] figure 1 It is a structural schematic diagram of the microwave frequency measuring device for fixed low-frequency detection of the present invention. The optical carrier output from the laser 1 is input into the suppressed carrier double sideband modulation module 2, the microwave signal to be measured generates a suppressed carrier double sideband modulated signal through the suppressed carrier double sideband modulation module 2, and the microwave modulated optical carrier output by the suppressed carrier double sideband modulation module 2 The optical beam splitter 3 is divided into branch 1 and branch 2. In branch 1, the suppressed carrier double sideband optical signal passes through the dispersion medium 4, and the phase difference of the two optical sidebands is changed by using the dispersion effect. In 2, suppressed carrier double sideband optical signal passes frequency shifter 5 to generate frequency f s frequency shift. The branch 1 and the branch 2 are co...

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Abstract

The invention relates to a microwave photon frequency measuring device and method based on fixed low-frequency detection, and belongs to the technical field of photoelectronics. The device comprises a laser, a carrier suppression double-sideband modulation module, an optical beam splitter, a dispersive medium, a frequency shifter, an optical coupler, a photoelectric detector and a signal acquisition and data processing module. The laser, the carrier suppression double-sideband modulation module, the optical beam splitter, the dispersive medium, the frequency shifter, the optical coupler (6) and the photoelectric detector are sequentially and optically connected; and the photoelectric detector and the signal acquisition and data processing module are in circuit connection in sequence. According to the invention, the defect that a broadband photoelectric detection and processing system needs to be used in the existing microwave photon frequency measurement technology is overcome, and the method has the advantages of high measurement precision, real-time measurement, need for a low-frequency detection and processing system only and the like.

Description

technical field [0001] The invention belongs to microwave photon frequency measurement technology, in particular to a microwave photon frequency measurement device and method based on fixed low frequency detection. Background technique [0002] Microwave receivers used for radar and electronic warfare need to estimate unknown microwave frequencies over a wide bandwidth. The traditional instantaneous microwave frequency measurement technology is limited by the "electronic bottleneck" of microwave devices, resulting in limited measurement bandwidth, and at the same time, the frequency-sweeping measurement takes a long time , and susceptible to electromagnetic interference. In recent years, with the continuous development of microwave photonic technology and the maturity of optoelectronic device manufacturing technology, microwave frequency measurement based on microwave photonic technology has become a major research hotspot. This technology has the advantages of wide bandwidt...

Claims

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Application Information

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IPC IPC(8): G01R29/08G01R23/02
CPCG01R29/0885G01R23/02
Inventor 邹新海杜森阳王恒亓林魏珅黎人溥邸克刘宇
Owner CHONGQING UNIV OF POSTS & TELECOMM
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