Broadband dielectric material measuring system and method
A dielectric material and measurement system technology, applied in the field of measurement systems, can solve the problems of limited ultra-low frequency measurement, low degree of automation, and poor user interaction, so as to improve test and experiment efficiency, improve utilization efficiency, and reduce time costs. Effect
Pending Publication Date: 2021-12-14
TAIYUAN UNIV OF TECH
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Problems solved by technology
[0005] In order to solve the problems of limited ultra-low frequency measurement, low test efficiency, poor interaction with users, poor function expansion, and low degree of automation in the prior art, the present invention provides a wide-band dielectric material measurement system and method
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[0046] In order to enable those skilled in the art to better understand the technical solution of the present invention, the following in conjunction with the attached Figure 1 to Figure 6 The present invention will be described in detail.
[0047] For better understanding, as figure 1 As shown, a wide-band dielectric material measurement system includes: a host computer PC, a lock-in amplifier, a single-chip microcomputer, and an automatic balancing bridge circuit.
[0048] The upper computer PC is equipped with test software written by LabVIEW to control the lower computer system composed of a lock-in amplifier, a single-chip microcomputer, and an automatic balancing bridge circuit to realize automatic measurement, analysis, display, and data storage functions.
[0049] The lock-in amplifier is connected to the host computer through the GPIB bus, and the host computer controls the output frequency range of 1mHz to 100kHz 0-1V voltage excitation signal to measure the bridge...
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The invention discloses a broadband dielectric material measuring system and method. The broadband dielectric material measuring system is composed of an upper computer PC, a lock-in amplifier, a single-chip microcomputer and an automatic balance bridge circuit. The upper computer controls the lock-in amplifier to output a measurement excitation signal, a free axis measurement method is adopted, voltage amplitudes and phase angles of the to-be-measured sample and the reference resistor are measured through the lock-in amplifier, and performance parameters of the dielectric material are further obtained through software processing of the upper computer. The measuring process and the data processing process are both automatic, the testing efficiency is improved, and the cost is reduced. The method is suitable for measuring the dielectric material for manufacturing the parallel-plate capacitor, and is applied to the technical field of dielectric material measurement.
Description
technical field [0001] The invention is applied to the technical field of dielectric material measurement, and specifically relates to an automatic measurement method and a measurement system for the performance parameters of dielectric materials in a wide frequency range of 1mHz to 100kHz. Background technique [0002] Dielectric materials refer to a class of substances that generate polarization under the action of an external electric field. Due to the diversity of response modes of dielectric materials to external electric fields, they are widely used in electronic circuits, communication technology and other fields, and are often used to manufacture various electronic devices such as capacitors, filters, resonators, and memories. Testing the electrical properties of dielectric materials is an important scientific basis for exploring the microcosmic mechanism of dielectrics, manufacturing, selecting, researching and developing dielectrics. [0003] The electrical perfor...
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Login to View More IPC IPC(8): G01R27/26
CPCG01R27/2694Y02P90/02
Inventor 黄海涛郝文涛孙礼张翠玲赵江鹏
Owner TAIYUAN UNIV OF TECH