Test method and system of TTE switch, storage medium and computer equipment
A test method and switch technology, applied in computing, transmission systems, memory systems, etc., can solve problems such as inability to complete TT service scheduling in TTE networks, inability to complete time between local clock and device under test, and huge buffer space requirements. To achieve the effect of convenient function test, simple implementation method and improved flexibility
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[0054] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0055] Aiming at the problems existing in the prior art, the present invention provides a test method, system, storage medium, and computer equipment for a TTE switch. The present invention will be described in detail below in conjunction with the accompanying drawings.
[0056] Such as figure 1 Shown, the testing method of the TTE exchange provided by the present invention comprises the following steps:
[0057] S101: Store the software configuration flow information in Block RAM, and deliver the configuration control information to control the generation of flow;
[0058] S102: Obtain the control instruction according t...
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