Mirror cutting needle type probe and processing method
A processing method and needle technology, which is applied in the field of test probes, can solve the problems of easy contamination of the needle and large roughness of the needle, and achieve the effect of not easy to stain, small roughness, and good finish
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2022-07-22
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of test probes, in particular to a mirror-cut needle-type probe, and also relates to a processing method for a mirror-cut needle-type probe. Background technique
[0002] With the rapid development of the probe industry, the use of probes has become wider and wider. Test probes can be used to test the characteristics of power-on and signal transmission equipment such as integrated circuits. Due to the different shapes of the tested solder joints of integrated circuits, the design of the shape of the test probe tip is particularly important. The traditional needle shape is a pointed or flat head made by turning, but there are many problems when using it. For example, the surface roughness of the needle is large, and after a period of testing, the surface of the needle is easily stained, which affects the stability of subsequent tests. Therefore, it is extremely important to solve this problem. SUMMARY OF T...
Examples
Embodiment Construction
[0025] The following describes in detail the embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as a limitation of the present invention.
[0026] In the description of the present invention, if it is described that the first and the second are only for the purpose of distinguishing technical features, it should not be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating The order of the indicated technical features.
[0027] In the description of the present invention, unless otherwise clearly defined, words such as sett...