Integrated circuit,method and apparatus for fine tuning clock signals of an integrated circuit
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- IP FIRST
- Publication Date
- 2007-06-20
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Abstract
Description
technical field
[0001] The present invention relates to the frequency of successive logic blocks on an integrated circuit, especially for fine-tuning and permanently programming the skew of clock signals after critical timing path identification and analysis in debug and test procedures ) method and device. Background technique
[0002] Integrated circuit designers have used simulation and / or testing to identify, isolate, and analyze timing problems on chips that, at best, prevent the chip from performing at the target clock speed, but at worst Situations can result in chips that must be modified in design before mass production. Typically, buffer logic cells within each logic block on the chip are used to pass data to subsequent logic stages or to receive data from previous logic stages. If the operation performed by a logic block has an associated critical delay path (critical delay path), and it causes valid data at a specific clock speed, it will not be sent to the loc...