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Integrated circuit,method and apparatus for fine tuning clock signals of an integrated circuit

An integrated circuit, signal technology, applied in the direction of the phase angle between voltage and current, multiple input and output pulse circuits, electrical components, etc., can solve problems such as the inability of the chip to operate

Active Publication Date: 2007-06-20
IP FIRST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Worse, a sustain time issue at this point would render the chip completely inoperable

Method used

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  • Integrated circuit,method and apparatus for fine tuning clock signals of an integrated circuit
  • Integrated circuit,method and apparatus for fine tuning clock signals of an integrated circuit
  • Integrated circuit,method and apparatus for fine tuning clock signals of an integrated circuit

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Embodiment Construction

[0040] The following description is provided in the context of specific embodiments and prerequisites thereof to enable a person of ordinary skill in the art to utilize the invention. However, various modifications to the embodiments will be apparent to those skilled in the art, and the general principles discussed herein can also be applied to other embodiments. Thus, the present invention is not limited to the specific embodiments shown and described herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0041] The present invention provides an integrated circuit (IC) designer with a device and method for dynamically controlling the regional clock and programming the optimal clock phase difference when testing and debugging an integrated circuit. into a composite element. Accordingly, the present invention develops a device and method for fine-tuning the integrated circuit clock signal on a combined component, wh...

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PUM

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Abstract

The invention provides an integrated circuit and a method and system for adjusting an integrated circuit clocked signal, which comprises a plurality of skew-programmable clock buffer, a fixed phase logic unit, an external interface and a skew controller. Each skew-programmable clock buffer is used for receiving a distributing clocked signal to provide a corresponding local clock signal with a programmed skew. The fixed phase logic unit enables permanent programming of static skew values and the external interface enables programming of dynamic skew values. The skew controller selects between the static and dynamic skew values and programs the skew-programmable clock buffers based on selected skew values. When using the invention by laser, the best area clock skew of the element can be detected when detecting one element to reach maximum clock speed of the element.

Description

technical field [0001] The present invention relates to the frequency of successive logic blocks on an integrated circuit, especially for fine-tuning and permanently programming the skew of clock signals after critical timing path identification and analysis in debug and test procedures ) method and device. Background technique [0002] Integrated circuit designers have used simulation and / or testing to identify, isolate, and analyze timing problems on chips that, at best, prevent the chip from performing at the target clock speed, but at worst Situations can result in chips that must be modified in design before mass production. Typically, buffer logic cells within each logic block on the chip are used to pass data to subsequent logic stages or to receive data from previous logic stages. If the operation performed by a logic block has an associated critical delay path (critical delay path), and it causes valid data at a specific clock speed, it will not be sent to the loc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03K5/22H03L7/00G01R25/00G01R29/02
Inventor 苏瑞叙·阿里哈那史坦利·何詹姆斯·R·朗勃格
Owner IP FIRST
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