Nano scale particle size measuring method and device with scattered dynamic low-strength laser

A technology of dynamic light scattering and nano-particles, applied in the field of measurement, can solve the problems of unsuitable industrial site detection, resource waste, and bulky water cooling system, and achieve the effect of maintaining naturalness, low overall cost, and small device volume

Inactive Publication Date: 2003-03-19
SOUTH CHINA NORMAL UNIVERSITY
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  • Abstract
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Problems solved by technology

However, photon correlation spectrometers currently used in scientific research and production use high-power light sources and bulky water-cooling systems, which are not suitable for detection on industrial sites, and are likely to cause serious waste of resources

Method used

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  • Nano scale particle size measuring method and device with scattered dynamic low-strength laser
  • Nano scale particle size measuring method and device with scattered dynamic low-strength laser
  • Nano scale particle size measuring method and device with scattered dynamic low-strength laser

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Embodiment 1

[0034] figure 1 A schematic diagram of the device showing the method for measuring the particle size of nanoparticles by using low-intensity laser dynamic light scattering according to the present invention. The device is mainly composed of a laser 1, a polarizer 2, a focusing lens 3, a double-layer refractive index sample matching pool 4, a single-mode fiber 5, a photon counting module 6, an autocorrelator 7, a computer 8, and a total reflection prism 9. The laser 1 provides coherent light; the polarizer 2 converts the outgoing laser light into linearly polarized light; the focusing lens 3 focuses the polarized light into the double-layer refractive index sample matching cell 4; the double-layer refractive index sample matching cell 4 and the photon counting module 5 It is connected through a single-mode gradient-index optical fiber 5; the photon counting module 6, the autocorrelator 7, and the computer 8 are sequentially connected with signals. A total reflection prism 9 is...

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Abstract

The present invention provides nano particle size measuring method and device with scattered dynamic low-strength laser. The method includes: radiating liquid sample with monochromic laser beam of proper length to produce scattered light signal; collecting and transmitting to light signal with single-modular fiber with gradient refractive index; recording with single-photon counter module the scattered photons and converting into output electric pulse signal; and processing the signal in an autocorrelator. The device includes: light source, polarizer, focusing lens, two-layered refractive index sample matching pool, fiber, single-photon counter module, autocorrelator and computer. The present invention can measure nano particle size fast and accurately.

Description

technical field [0001] The invention relates to measurement technology, in particular to a method for measuring the diameter of nanoparticles by dynamic light scattering. [0002] The invention also relates to a device for realizing the method for measuring the diameter of nanoparticles by dynamic light scattering. Background technique [0003] At present, there are many analytical techniques for the size and distribution of nanoparticles. Although the transmission electron microscope observation method is an absolute method for the observation and determination of particle size, which is reliable and intuitive, the measurement results of this method lack statistics and cannot represent the particle size range of the overall particle; The result is the grain size of the particles. This measurement method is only suitable for the evaluation of the grain size of crystalline nanoparticles, and the measurement range is narrow, only within 50 nanometers; due to the shape and def...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02G01N21/47
Inventor 邢达李绍新
Owner SOUTH CHINA NORMAL UNIVERSITY
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