Non-polarized composite gallium nitride substrate lining and production method
A GaN-based, non-polarized technology, used in electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problem of heat dissipation of high-power devices, easy breakdown of devices, and reduce the electron and Hole binding efficiency and other issues, to achieve the effect of high heat conduction efficiency
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[0047] The first specific implementation example of the process flow step 112: using MOCVD, grow a layer of gallium nitride substrate with a thickness between 1 nm and 90 nm on the r-plane sapphire growth substrate (at a temperature of 400-900 ° C). Nucleation layer. The material of the crystal nucleus layer includes, but is not limited to, gallium nitride. An a-plane non-polarized first GaN-based epitaxial layer is grown on the crystal nucleus layer. A specific implementation example of growing a non-polarized a-plane first gallium nitride-based epitaxial layer: growing a non-polarized a-plane at a temperature above about 1000° C. and at a pressure less than 1 atmosphere, with an appropriate V / III ratio The thickness of the first GaN-based epitaxial layer is 1-5 microns.
[0048] A second specific implementation example of process flow step 112: using MBE, grow an aluminum nitride buffer layer on an m-plane 6H-silicon carbide growth substrate, and then grow an m-plane first...
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