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30results about How to "Reduce thermal mismatch stress" patented technology

High-power LED lamp effectively lowering packaging thermal resistance

The technical problem provides a high-power LED lamp effectively lowering packaging thermal resistance, which has a novel structure, and lowers thermal mismatching stress without greatly increasing the heat sink thickness. The technical scheme is that: the high-power LED lamp effectively lowering the packaging thermal resistance comprises a metallic base, an LED chip packaged on the metallic base, a metallic conductor and a packaging colloid, wherein a heat sink buffer layer, used for buffering the thermal mismatching stress between the LED chip and the metallic base, is arranged between the metallic base and the LED chip; the heat sink buffer layer is an FeNi alloy layer electroplated on the metallic base, and the FeNi alloy layer is between 2 and 5 micrometers in thickness; the LED chip and the heat sink buffer layer are connected in a mode of eutectic welding; the Ni content in the FeNi alloy layer is 36 percent; and the metallic base 1 is made of copper materials with better heat-conducting property. The high-power LED lamp effectively lowering the packaging thermal resistance has a novel structure, and effectively lowers the thermal mismatching stress so as to ensure the efficacy and service life of the high-power LED lamp.
Owner:DONGGUAN KINGSUN OPTOELECTRONIC CO LTD

Indium gallium nitride thin film on flexible transparent polyimide substrate and preparation method of indium gallium nitride thin film

The invention belongs to the technical field of manufacturing of group-III nitride thin films and devices and provides an indium gallium nitride thin film on a flexible transparent polyimide substrateand a preparation method of the indium gallium nitride thin film. Polyimide is taken as a substrate and a first In<x>Ga<1-x>N buffer layer, a graphene layer, a one-dimensional nano-conductive material layer, a second In<x>Ga<1-x>N buffer layer and an In<x>Ga<1-x>N epitaxial layer are sequentially prepared on one side surface of the polyimide substrate from inside to outside, wherein the first In<x>Ga<1-x>N buffer layer, the second In<x>Ga<1-x>N buffer layer and the In<x>Ga<1-x>N epitaxial layer all are prepared by using an electron cyclotron resonance-plasma enhanced metal organic chemical vapor deposition method at low temperature; and the graphene layer and the one-dimensional nano-conductive material layer are prepared by using a spin coating method, so that the prepared high-quality In<x>Ga<1-x>N thin film can be used for preparing flexible transparent devices, such as an indium gallium nitride-based solar cell and a thin-film transistor and has a broad application prospect.
Owner:DALIAN UNIV OF TECH

A method for enhancing the bonding strength of sog process microstructure

The invention discloses a method for enhancing the bonding strength of an SOG (silicon on glass) process microstructure. According to the method, an operation of microstructure bonding is implemented by using a combined anchor point structure consisting of a plurality of anchor points. Preferably, the combined anchor point is in an array form. The number of the anchor points, through which the bonding strength of the combined anchor point structure is maximal, can be determined through a stretching or shear fracture test, and taken as the number of the anchor points in the combined anchor point. The size of gaps between the anchor points in the combined anchor point can be determined according to two factors including the minimum photoetching allowed spacing and the limited spacing for keeping the facilitation of stress release. The invention also provides an MEMS (micro-electromechanical system) device using the combined anchor point structure. According to the invention, the thermal mismatch stress caused in the technological process is reduced through a reasonable design on the distribution of the anchor points, so that the bonding strength of a microstructure manufactured based on an SOG process is enhanced, therefore, the technological rate of finished products can be significantly improved, and the reliability of the MEMS device manufactured based on the SOG process can be improved.
Owner:PEKING UNIV

Indium gallium nitride thin film on flexible transparent polyimide substrate and preparation method thereof

The invention belongs to the technical field of manufacturing of group-III nitride thin films and devices and provides an indium gallium nitride thin film on a flexible transparent polyimide substrateand a preparation method of the indium gallium nitride thin film. Polyimide is taken as a substrate and a first In<x>Ga<1-x>N buffer layer, a graphene layer, a one-dimensional nano-conductive material layer, a second In<x>Ga<1-x>N buffer layer and an In<x>Ga<1-x>N epitaxial layer are sequentially prepared on one side surface of the polyimide substrate from inside to outside, wherein the first In<x>Ga<1-x>N buffer layer, the second In<x>Ga<1-x>N buffer layer and the In<x>Ga<1-x>N epitaxial layer all are prepared by using an electron cyclotron resonance-plasma enhanced metal organic chemical vapor deposition method at low temperature; and the graphene layer and the one-dimensional nano-conductive material layer are prepared by using a spin coating method, so that the prepared high-quality In<x>Ga<1-x>N thin film can be used for preparing flexible transparent devices, such as an indium gallium nitride-based solar cell and a thin-film transistor and has a broad application prospect.
Owner:DALIAN UNIV OF TECH

A kind of preparation method of bulge sample of layered electromagnetic thin film material

ActiveCN103762307BMeet the requirements of different annealing temperaturesHigh affinityGalvano-magnetic device manufacture/treatmentFerroelectric thin filmsMixed materials
The invention discloses a filling material for manufacturing a layered electromagnetic thin film material swelling sample and a method for preparing the filling material, and provides a method for adopting the filling material to manufacture the layered electromagnetic thin film material swelling sample. The method includes the steps that firstly, a through hole is machined in a silicon dioxide substrate through a precision micromachining method; the through hole is filled with a specially-made mixing material, and metallographic phase polishing processing is conducted on the through hole; the surface of the substrate is plated with an annular bottom electrode through an ion sputtering method, a ferroelectric thin film and a ferromagnetic thin film are sequentially deposited through a sol-gel method, annealing is conducted, and an annular top electrode is deposited on the surfaces of the thin films after being cleaned and dried; acetone analytical reagents and a sodium hydroxide solution are used for corrosion to remove the filling material in the through hole, an independently-supported thin film window is formed, and then the electromagnetic thin film swelling sample suitable for a swelling test is obtained. The method is easy and convenient to operate and high in manufacturing efficiency, and the manufacturing method of the layered electromagnetic thin film material swelling sample is suitable for the swelling test.
Owner:湖南新生代新材料科技有限公司
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