Method for manufacturing a semiconductor device
一种半导体、控制栅的技术,应用在半导体器件、半导体/固态器件制造、电固体器件等方向,能够解决不能内置所需容量、增加芯片尺寸、不能应用高存储器集成度等问题
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[0011] Hereinafter, a detailed description of preferred embodiments of the present invention will be provided with reference to the accompanying drawings.
[0012] Figure 1 to Figure 11 is a cross-sectional view illustrating a method for fabricating a semiconductor device according to certain embodiments of the present invention.
[0013] First, if figure 1 As shown, a substrate 10 is provided, which is defined as: a peripheral circuit area, in which logic devices will be formed (hereinafter referred to as "first area A"); an electrically erasable programmable read-only memory (EEPROM) cell area, in which An EEPROM cell (hereinafter referred to as "second area B") will be formed; and a flash area in which flash memory cells will be formed (hereinafter referred to as "third area C").
[0014] Next, a plurality of device isolation layers 11 are formed to isolate the first region A, the second region B and the third region C from each other. At this time, the device isolation...
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