Method for preparing Al-Si-Cu-based alloy metallographic sample and displaying tissue thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- KONFOONG MATERIALS INTERNATIONAL CO LTD
- Publication Date
- 2007-05-23
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention belongs to the technical field of metallographic sample preparation, and in particular provides a method for preparing an aluminum-silicon-copper alloy metallographic sample and a method for displaying the structure. Background technique
[0002] Due to the low hardness of 99.999% high-purity aluminum, pure aluminum and some aluminum alloys are very soft. When preparing metallographic samples, it is easy to scratch the surface during grinding and polishing, and it is difficult to obtain a very bright metallographic sample. It is more difficult to display the grain boundary of high-purity aluminum than that of ordinary aluminum. After corroding a sample with a dull surface, it will be difficult to completely display the grain boundaries, or even distinguish the grain boundaries, and it is difficult to measure the average grain size of the sample; and under low pressure, aluminum will deform, that is, after polishing Surface flow and defor...