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Metal-insulator-metal capacitor

A technology of metal capacitors and insulators, which is applied in the direction of fixed capacitor dielectrics, semiconductor devices, and parts of fixed capacitors, and can solve problems such as leakage and damage to other layer materials

Inactive Publication Date: 2007-06-27
IND TECH RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, to make TiO 2 The transformation from the anatase phase formed by the general atomic layer deposition (Atomic Layer Deposition, ALD) to the rutile phase usually requires high-temperature calcination (about 700 degrees Celsius or more) to achieve phase transfer. ), such a high temperature will cause damage to other layer materials (damage)
In addition, because TiO 2 The energy band gap (band gap) is small, so there are serious leakage problems

Method used

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  • Metal-insulator-metal capacitor

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Embodiment Construction

[0025] FIG. 1 is a cross-sectional view of a metal-insulator-metal (MIM) capacitor according to a preferred embodiment of the present invention.

[0026] Referring to FIG. 1 , a metal-insulator-metal (MIM) capacitor 100 of the present embodiment includes a lower electrode 102 , an upper electrode 104 and a capacitor dielectric layer 106 . The upper electrode 104 is located on the lower electrode 102 , and the capacitive dielectric layer 106 is located between the upper electrode 104 and the lower electrode 102 . And the capacitive dielectric layer 106 mainly comprises multi-layer TiO 2 layer 108 and at least one layer 110 of a tetragonal crystal structure material layer 110, wherein the tetragonal crystal structure material layer 110 is located between two TiO 2 Between the layers 108, and each layer 110 of the tetragonal crystal structure material has the same thickness, so that such a thin film can be formed by repeating the same process parameters. The material of the abo...

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Abstract

This invention puts forward a MIM capacitor including a lower electrode, an upper electrode and a capacitor medium layer, in which, the upper electrode is placed at the lower electrode, the capacitor medium layer is placed between the upper and lower electrodes, the medium layer includes multiple TiO2 layers and at least one square crystal structure material layer, and the square crystal structure material layer is placed between two TiO2 layers and the thickness of the material layers is the same or different, which can cut off leakage paths with the help of the square crystal material layers among TiO2 layers and can induce it to generate rutile phase of high dielectric constant.

Description

technical field [0001] The present invention relates to a metal-insulator-metal (Metal-Insulator-Metal, abbreviated as MIM) capacitor, and in particular to a metal-insulator-metal capacitor with a high dielectric constant (highk) capacitance dielectric layer and low leakage. Background technique [0002] Semiconductor memory mainly includes transistors and capacitors, and when semiconductor memory enters a high-aspect-ratio process, it means that the space available for capacitors on components is reduced. As the storage space required by computer software grows rapidly, the required capacitance also increases. Therefore, in order to meet such demands, semiconductor process technology must be changed in process technology. [0003] The current method to increase capacitance without wasting space is to use a high dielectric constant (high-k) material as an insulating layer to manufacture a metal-insulator-metal (MIM) capacitor in order to obtain sufficient capacitance in a r...

Claims

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Application Information

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IPC IPC(8): H01G4/10H01G4/12H01L29/00
Inventor 林哲歆王庆钧李隆盛
Owner IND TECH RES INST