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Liquid crystal display device and fabrication method thereof

Inactive Publication Date: 2005-01-13
HITACHI LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0010] The TFT liquid crystal display device described in Japanese Patent Laid-Open No. 90404 / 1997 has the protective film made of the organic material, and the drain wiring lines are used as light-shielding electrodes, and pixel electrodes are disposed to overlap the drain wiring lines above the organic protective film of low dielectric constant, thereby improving the aperture ratio. However, patterning processing needs at least five photo-processes.
[0071] Although the metal films of the drain wiring lines, the source electrodes and the drain electrodes are removed through two separate etching processes, it is possible to improve the processing accuracy of the drain wiring lines by performing dry etching as the first process and wet etching as the second process.

Problems solved by technology

Moreover, in Japanese Patent Laid-Open No. 232409 / 1998, although the TFT glass substrate of a lateral electric field type, i.e., the IPS display mode, of liquid crystal display device is formed through four photo-processes, the terminals of its gate and drain wiring lines are not coated with a transparent conductive film such as Indium-Tin-Oxide (hereinafter, ITO), so that the terminals suffer the problem of electrical corrosion due to humidity.
In addition, since comb-teeth like pixel (source) electrodes are disposed close to the gate wiring lines, there is the problem that parasitic capacitance becomes large.
During a charge-holding period in such driving, electrons are emitted from the i-type semiconductor and the capacitance value fluctuates and lowers to a capacitance value which is a value for the thickness of the i-type semiconductor, resulting in the problem that image retention occurs in the liquid crystal.

Method used

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  • Liquid crystal display device and fabrication method thereof
  • Liquid crystal display device and fabrication method thereof
  • Liquid crystal display device and fabrication method thereof

Examples

Experimental program
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Effect test

embodiment 1

[0106] In the construction of this TFT section, one problem to be solved in terms of manufacturing yield factor is that the material of the transparent conductive film ITO1 which constitutes the pixel electrode PX, for example, ITO, does not have sufficient adhesion to the stepped undersurface, so that the transparent conductive film ITO1 may be easily disconnected during etching processing. Particularly in the cross-sectional structure shown in FIG. 2, the source electrode SD2 that lies near the contact hole CN has a large stepped interval because the a-Si films AS and d0 and the metal electrode d0 are stacked. In Embodiment 1, the a-Si contact film d0 projects from an overlying metal material d1 which constitutes the drain electrode SD1, and the a-Si channel film AS projects from the overlying a-Si contact film d0. The resultant steps constitute a staircase-like structure which is formed by the metal material d1, a semiconductor film including the a-Si contact film d0, and the por...

embodiment 2

[0133] Cross-sectional views of the fabrication process of the second photo-process of Embodiment 2 are shown in FIGS. 12A to 12C. The gate wiring line GL is formed on the TFT glass substrate SUB1, and an SiN film which becomes the gate insulating film GI, an i-type a-Si film which becomes the a-Si channel film AS and an n+-type a-Si film which becomes the a-Si contact film d0 are continuously deposited in this order on the TFT substrate SUB1 by a CVD method. Then, the metal film d1 for the source and drain electrodes SD1 and SD2 as well as the video signal line DL is deposited by a sputtering method without going through the photo-process (FIG. 12A).

[0134] Then, a photoresist is applied to the metal film d1, and is exposed and developed by using a photomask having a nontransparent area, a semitransparent area and a transparent area as shown in FIG. 7A of Embodiment 1, thereby forming a resist pattern PRES1 which is a thick portion corresponding to the nontransparent mask area and a...

embodiment 3

[0144] Cross-sectional views of the fabrication process of the third photo-process of Embodiment 3 are shown in FIGS. 15A to 15C. The gate wiring line GL is formed on the TFT glass substrate SUB1, and an SiN film which becomes the gate insulating film GI, an i-type a-Si film which becomes the a-Si channel film AS and an n+-type a-Si film which becomes the a-Si contact film d0 are continuously deposited in this order on the TFT substrate SUB1 by a CVD method. Then, the metal film d1 for the source and drain electrodes SD1 and SD2 as well as the drain wiring line DL is deposited by a sputtering method without passing through the photo-process. Then, the source and drain electrodes SD1 and SD2 are processed by a halftone exposure and development method, and a half-etched island-shaped a-Si channel film AS is formed in the section of the charge-holding capacitance Cstg section. Moreover, photo processing is done up to the TFT substrate SUB1 coated with the SiN protective film PSV by a C...

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PUM

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Abstract

The present invention provides a novel photolithography processes using photoresist pattern having at least two areas which has different thickness from each other for a fabrication method for a liquid crystal display device having reversed staggered and channel-etched type thin film transistors, reduce a number of photolithography processes required for whole of the fabrication process of the liquid crystal display device, and improve brightness of the liquid crystal display device.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] The present invention relates to a liquid crystal display device and, for example, to one of a pair of substrates between which a liquid crystal layer is interposed, i.e., a so-called TFT substrate on which thin film transistors (hereinafter referred to as TFTs) are formed, as well as to a fabrication method for such a TFT substrate. [0003] 2. Description of the Related Art [0004] In the case of a related art liquid crystal display device, as described in Japanese Patent Laid-Open No. 202153 / 1994, its TFT substrate is fabricated by forming openings in the gate insulating film and the protective film laminated on the TFT substrate, through one photo-process (a process which includes the photolithography of forming a photomask on a work and partly removing the photomask according to a processing pattern), and carrying out patterning through a total of five photo-processes. In the TFT substrate obtained by this fabrica...

Claims

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Application Information

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IPC IPC(8): G02F1/1343G02F1/1362G02F1/1368G02F1/136G09F9/30H01L21/302H01L21/3065H01L21/336H01L29/786
CPCG02F1/134363G02F1/13458G02F1/136213G02F1/136227H01L27/1288G02F2001/13629H01L27/1255H01L27/1248G02F2001/136236G02F1/136236G02F1/13629G02F1/136
Inventor ONO, KIKUONAKAYOSHI, YOSHIAKIOKE, RYUTAROKANEKO, TOSHIKI
Owner HITACHI LTD
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