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Circuit and electronic device including an enhancement-mode transistor

a technology of enhancement mode and transistor, which is applied in the direction of electronic switching, diodes, pulse techniques, etc., can solve the problem of compromising the control of transistors

Active Publication Date: 2020-01-09
SEMICON COMPONENTS IND LLC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent describes an electronic device including two transistors. The first transistor has a gate electrode and a gate terminal, while the second transistor has a source electrode, a gate electrode, and a drain electrode. The source and gate electrodes of the second transistor are connected to the gate electrode of the first transistor, while the drain electrode of the second transistor is connected to the gate terminal. This arrangement allows for more efficient coupling and better performance of the electronic device.

Problems solved by technology

Such attempts to increase the threshold voltage can result in too high of a threshold voltage, the threshold can become unstable and may shift over time, or control over the transistor may be compromised.

Method used

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  • Circuit and electronic device including an enhancement-mode transistor
  • Circuit and electronic device including an enhancement-mode transistor
  • Circuit and electronic device including an enhancement-mode transistor

Examples

Experimental program
Comparison scheme
Effect test

embodiment 1

[0067] An electronic device can include:[0068]a channel layer overlying a substrate;[0069]a barrier layer overlying the channel layer;[0070]a gate electrode of a first transistor overlying the channel layer, wherein the first transistor is an enhancement-mode transistor;[0071]a gate terminal; and[0072]a first component having a threshold voltage, wherein the first component is disposed along a current path between the gate terminal and the gate electrode.

[0073]Embodiment 2. The electronic device of Embodiment 1, wherein the first component is under a gate pad or under a gate runner.

[0074]Embodiment 3. The electronic device of Embodiment 1, wherein the first component is a first diode having an anode and a cathode, wherein the anode is coupled to the gate terminal, and the cathode is coupled to the gate electrode.

[0075]Embodiment 4. The electronic device of Embodiment 3, wherein the first diode is a Schottky diode, a pn junction diode, or a junction barrier diode.

[0076]Embodiment 5. ...

embodiment 5

[0085]Embodiment 14. The electronic of Embodiment 5, wherein:[0086]the channel layer includes GaN,[0087]the barrier layer includes AlxGa(1-x)N, wherein 0[0088]the first transistor is an enhancement-mode high electron mobility transistor,[0089]the gate electrode includes a p-type semiconductor material,[0090]the second component is:[0091]a second diode having an anode and a cathode, wherein the anode of the second diode is coupled to the cathode of the first diode, and the cathode of the second diode is coupled to the anode of the first diode, or[0092]a second transistor that is a depletion-mode high electron mobility transistor having a source electrode, a gate electrode, and a drain electrode, wherein the source and gate electrodes of the second transistor are coupled to the cathode of the first diode, and the drain electrode of the second transistor is coupled to the anode of the first diode,[0093]a threshold voltage of the second component is less than a threshold voltage of the ...

embodiment 15

[0095] An electronic device can include:[0096]a channel layer overlying a substrate;[0097]a barrier layer overlying the channel layer;[0098]a gate electrode of a first transistor overlying the channel layer;[0099]a gate terminal; and[0100]a second transistor having a source electrode, a gate electrode, and a drain electrode, wherein the source and gate electrodes of the second transistor are coupled to the gate electrode of the first transistor, and the drain electrode of the second transistor is coupled to the gate terminal.

[0101]Embodiment 16. The electronic device of Embodiment 15, wherein the second transistor is a depletion-mode transistor.

[0102]Embodiment 17. The electronic device of Embodiment 16, wherein the first transistor is an enhancement-mode transistor.

[0103]Embodiment 18. The electronic device of Embodiment 15, wherein the first and second transistors are high electron mobility transistors.

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PUM

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Abstract

An electronic device can include a channel layer and a barrier layer overlying the channel layer. In an embodiment, the electronic device can include a component disposed along a current path between a gate terminal and a gate electrode of a first transistor. In another embodiment, the electronic device can include a second transistor wherein source and gate electrodes of the second transistor are coupled to the gate electrode of the first transistor, and a drain electrode of the second transistor is coupled to the gate terminal. A circuit can include a transistor and a diode. The transistor can include a drain, a gate, and a source, wherein the drain is coupled to a drain terminal, and the source is coupled to a source terminal. The diode can have an anode is coupled to the gate terminal, and a cathode is coupled to a gate of the transistor.

Description

FIELD OF THE DISCLOSURE[0001]The present disclosure relates to circuits and electronic devices, and more particularly to, circuits and electronic devices including enhancement-mode transistors.RELATED ART[0002]High electron mobility transistors can include enhancement-mode transistors. One type of such transistor can include a p-type GaN gate electrode. A high electron mobility transistor having a p-type GaN gate electrode can have a threshold voltage of approximately 1.5 V. In an attempt to increase the threshold voltage, a component may be added between a gate terminal and the p-type GaN gate electrode. The component may include a Schottky diode between a metal gate interconnect and the p-type GaN gate electrode, where the metal gate interconnect is coupled to the cathode of the Schottky diode, and the p-type GaN gate electrode is coupled to the anode of the Schottky diode. In another structure, an n-type GaN layer may be disposed between the metal gate interconnect and the p-type...

Claims

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Application Information

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IPC IPC(8): H01L29/778H01L27/088H01L27/06
CPCH01L27/0629H01L29/7786H01L27/0883H01L29/778H01L29/0607H01L27/0203H01L27/0605H01L21/8252H03K17/302H01L29/2003H01L29/872H01L29/861H01L29/205
Inventor JEON, WOOCHULVENKATRAMAN, PRASAD
Owner SEMICON COMPONENTS IND LLC