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Automatic control system and method for cyclic test in multiple service positions and at high and low temperatures

An automatic control system, high and low temperature cycle technology, applied in the direction of temperature control and electrical program control using electric methods, can solve the problem of accurately finding the number of low temperature cycles of the tested sample, long intervals between intermediate data tests, and reliable test data Temperature drop and other problems, to achieve stable working state and cooling time, stable liquid nitrogen output, and stable state

Active Publication Date: 2009-02-11
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
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  • Application Information

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Problems solved by technology

[0003] In the past, people used artificial perfusion of liquid nitrogen to carry out low-temperature cycle test methods. The work efficiency was low and the labor intensity was high. Moreover, due to the long-term boring work content, it was easy to cause mental fatigue, resulting in inconsistencies in the test status and other factors, which made the obtained test data difficult. Credibility drops
In addition, due to the complicated disassembly and assembly of the tested part, the interval between intermediate data tests is long, which is not conducive to accurately finding the number of low-temperature cycles where the tested sample fails.

Method used

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  • Automatic control system and method for cyclic test in multiple service positions and at high and low temperatures
  • Automatic control system and method for cyclic test in multiple service positions and at high and low temperatures
  • Automatic control system and method for cyclic test in multiple service positions and at high and low temperatures

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Embodiment Construction

[0049] The following is based on Figure 1 ~ Figure 3 The preferred embodiments of the present invention are given and described in detail so that those skilled in the art can more easily understand the structural features and functional features of the present invention, rather than to limit the scope of the present invention.

[0050] Please refer to figure 1 As shown, it provides a block diagram of the automatic control workflow of the multi-station high and low temperature cycle test of the present invention. As shown in the figure, the present invention provides a high and low temperature automatic cycle using liquid nitrogen as a refrigerant, liquid nitrogen storage tank liquid level constant pressure control, temperature data feedback through a temperature sensor, computer automatic control, and a special special Dewar. The test system is a high and low temperature cycle test system with multi-station automatic control.

[0051] Its workflow is as follows:

[0052] F...

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Abstract

A method for automatically controlling high-low temperature circulation test of multistation includes using component with controllable transmission rate to control cooling liquid nitrogen to be inputted to Dewar flask automatically through vacuum liquid transportation pipe, controlling temperature decreasing curve of tested component by computer and recording time data of said temperature decrease in real time, arranging vacuum exhaust unit for Dewar flask for carrying out vacuum exhaust of Dewar flask on test station. The control system used to realize said method is also disclosed.

Description

Technical field: [0001] The invention relates to an automatic control method and device for a high-low temperature cycle test, in particular to an automatic control method and a test device for a multi-station high-low temperature cycle test using liquid nitrogen as a refrigerant. Background technique: [0002] Due to the incomparable and unique advantages of infrared technology, infrared detection technology has been widely used in civil fields such as military defense, atmospheric monitoring, land and resources investigation, and weather forecasting, and is continuing to develop vigorously. The core component of infrared detection technology is the infrared detector. As we all know, highly sensitive infrared detectors are components that work at low temperatures (eg 77K). The general detector packaging structure is composed of several materials. Due to the difference in thermal expansion coefficient of various materials, when the detector drops from room temperature (300K...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/02G05D23/19
Inventor 张勤耀胡建人王正官
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI