Semiconductor storage device and manufacturing method thereof
A storage device and manufacturing method technology, applied in semiconductor/solid-state device manufacturing, transistors, electrical components, etc., can solve problems such as the integration of the peripheral circuit process of planar transistors and the complexity of the dynamic random access memory manufacturing process.
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[0137] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0138]2A to 2C are schematic structural views of the semiconductor storage device of the present invention. 2A is a top view, FIG. 2B is a cross-sectional view along AA1, and FIG. 2C is a cross-sectional view along BB1. As shown in FIG. 2B or FIG. 2C , the conduction channel of the transistor formed by columnar silicon islands 210 is formed on the semiconductor substrate 200 , and the depth of the silicon islands 210 is 0.07-0.3 microns. A drain 212 is formed on the top of the silicon island 210, and an insulating layer 216 is formed on the sidewall of the silicon island 210. The insulating layer 216 may be silicon oxide (SiO2), silicon oxynitride (SiON) and other High dielectric constant oxide. A first conductive layer 218 is formed...
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