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Semiconductor storage device and manufacturing method thereof

A storage device and manufacturing method technology, applied in semiconductor/solid-state device manufacturing, transistors, electrical components, etc., can solve problems such as the integration of the peripheral circuit process of planar transistors and the complexity of the dynamic random access memory manufacturing process.

Active Publication Date: 2007-12-19
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Therefore, the object of the present invention is to provide a semiconductor storage device and its manufacturing method to solve the problem in the prior art that the gate-around transistor DRAM manufacturing process is complicated and cannot be integrated with the peripheral circuit process of the planar transistor

Method used

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  • Semiconductor storage device and manufacturing method thereof
  • Semiconductor storage device and manufacturing method thereof
  • Semiconductor storage device and manufacturing method thereof

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Embodiment Construction

[0137] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0138]2A to 2C are schematic structural views of the semiconductor storage device of the present invention. 2A is a top view, FIG. 2B is a cross-sectional view along AA1, and FIG. 2C is a cross-sectional view along BB1. As shown in FIG. 2B or FIG. 2C , the conduction channel of the transistor formed by columnar silicon islands 210 is formed on the semiconductor substrate 200 , and the depth of the silicon islands 210 is 0.07-0.3 microns. A drain 212 is formed on the top of the silicon island 210, and an insulating layer 216 is formed on the sidewall of the silicon island 210. The insulating layer 216 may be silicon oxide (SiO2), silicon oxynitride (SiON) and other High dielectric constant oxide. A first conductive layer 218 is formed...

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Abstract

This invention discloses a semiconductor circuit and its manufacturing method, in which, said circuit includes a storage unit array and a peripheral loop, and the storage unit includes a vertical ciculating grid transistor and a groove capacitor under the transistor, the peripheral loop is composed of conventional plane transistors, the menufacturing method includes: forming a vertical circulation grid transistor array on the substrate of the semiconductor and forming a storage capacitor under the transistor.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a dynamic random access memory and a manufacturing method thereof. Background technique [0002] DRAM (Dynamic Random Access Memory) is one of the most important memory storage components at present. Due to its high function but low manufacturing cost, it is widely used in the fields of computers, communications, and home appliances. A dynamic memory cell generally includes a capacitor as a storage source for storing data and a switch and pass transistor for controlling access to data in the capacitor. In the prior art, planar transistors and stacked capacitors are mostly used. FIG. 1A is a cross-sectional view of a DRAM storage unit composed of planar transistors and stacked capacitors in the prior art. As shown in FIG. 1A, a source 101 and a drain 102 are formed on a substrate 100, and a gate oxide layer 103, a polysilicon layer 104, and a metal silicide 1...

Claims

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Application Information

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IPC IPC(8): H01L27/108H01L21/8242
Inventor 邢溯杨勇胜肖德元陈国庆
Owner SEMICON MFG INT (SHANGHAI) CORP
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