Photoetching mask structure for aeration of X-ray and method for preparing same
Patent Information
- Authority / Receiving Office
- CN Β· China
- Current Assignee / Owner
- INST OF MICROELECTRONICS CHINESE ACAD OF SCI
- Publication Date
- 2009-08-26
- Estimated Expiration
- Not applicable Β· inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the fields of microelectronics, nano-processing and X-ray photolithography, in particular to a photolithography mask structure for X-ray exposure and a preparation method thereof. Background technique
[0002] X-ray lithography plays an important role in microelectronics, nanofabrication and X-ray optics. Using deep submicron and even nanometer X-ray lithography technology, various practical devices have been manufactured, such as high-frequency T-gate compound semiconductor devices, surface acoustic wave sensors, and high-aspect-ratio X-ray diffraction optical elements.
[0003] In the development of X-ray lithography, the development of X-ray mask has always been an important part of X-ray lithography technology. The X-ray lithography mask is a hollow film formed by light element materials with low atomic number (polyimide, SiNx, SiC, and diamond, etc.) and a high atomic number metal absorber (such as gold, tungsten, and tan...