ICP-MS measuring method of trace metal impurities in high purity lead

Abstract

The invention relates to an ICP-MS measuring method of trace metal impurities in high purity lead, which adopts a high-purity nitric acid dissolving sample and uses the electrolytic method to remove lead in the high purity nitric acid dissolving sample, and utilizes inductive coupled plasma mass spectrometer and adopts peak jumping mode to scan and test blank, work-curve standard solution and sample elements to be detected so as to obtain the content of the elements to be detected. The ICP-MS measuring method of trace metal impurities in high purity lead is convenient in operation and can effectively eliminate matrix effect caused by excessively high total solid content and avoid pollution during the preparation process of samples, thus greatly reducing memory effect and obviously increasing measuring accuracy. The ICP-MS measuring method of trace metal impurities in high-purity lead is applicable to the analysis and testing of the content of a plurality of trace metal impurities.

Description

[0001] 1. Field [0002] The invention belongs to the technical field of analysis and testing, and relates to the processing and testing technology of trace impurities in high-purity metals, in particular to an ICP-MS method for trace impurities in high-purity metals. 2. Background technology [0003] Usually, the determination method of trace metal impurities in high-purity lead adopts atomic absorption method, and electrolytic method or precipitation method is used for sample treatment to remove a large amount of lead in the sample, and after concentration, atomic absorption method is used for determination of impurity components. This method is simple to operate, but the matrix effect is serious. Since the detection limit of the atomic absorption method is relatively high, sample concentration is necessary, and other impurities are easily brought into the concentration process, thereby affecting the measurement accuracy. [0004] The ICP-MS method has been widely used in th...

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Problems solved by technology

This method is simple to operate, but the matrix effect is serious. Since the detection limit of the atomic absorption method is relatively high, sample concentration is necessary, and other impurities are easily brought into the concentration process, thereby affecting the measurement accuracy.

[0004] The ICP-MS method has been widely used in the detection of trace and trace elements, but the high total dissolved solids (TDS) will cause the gradual clogging of the sampling cone, which will seriously suppress the signal and cause serious memory effects

Huang Donggen et al. introduced an ICP method using sulfuric acid precipitation to process samples in the article "ICP-MS Determination of Trace and Impurity Components in Lead Grids" ("Physical and Chemical Detection-Chemical Volume" 2006, 42 (1) 31-34). -MS metal impurity detection method, using the sulfuric acid precipitation method to remove a large amount of lead, and then use the ICP-MS method to detect the metal impurities, due to the complexity of the sulfuric acid matrix spectrum, it is easy to produce polyatomic ion interference, thus affecting the measurement accuracy