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Ultrahigh-speed comparator with low offset

An ultra-high-speed, comparator technology, used in instruments, multiple input and output pulse circuits, analog-to-digital conversion, etc., can solve problems affecting comparator accuracy, large offset voltage, and limiting the application of CMOS latch comparators, etc. The effect of meeting the needs of good design, improving speed, and meeting the needs of design

Inactive Publication Date: 2011-06-08
陕西光电子先导院科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the multi-stage open-loop comparator is easy to achieve high speed and high precision. However, due to the limitation of the bandwidth of the operational amplifier, the speed of this type of comparator is difficult to reach Gsps (megabits per second), so the general ultra-high-speed comparator The comparator adopts the structure of latching comparator to meet the requirement of speed
[0004] In the process of realizing the present invention, it is found that there are at least the following problems in the prior art: the general CMOS (Complementary Metal Oxide Semiconductor) latch comparator has a large offset voltage (even reaches 50mV sometimes), which seriously affects the comparator The accuracy limits the application of CMOS latch comparators in high-speed high-precision analog-to-digital converters

Method used

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  • Ultrahigh-speed comparator with low offset

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Embodiment Construction

[0028]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with the embodiments and the accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.

[0029] At first, the technical term involved in the present invention is explained:

[0030] PMOS: P-channel metal oxide semiconductor FET, P-channel metal oxide semiconductor field effect transistor;

[0031] NMOS: N-channel metal oxide semiconductor FET, N-channel metal oxide semiconductor field effect transistor.

[0032] see figure 1 , is a functional structural block diagram of an ultra-high-speed comparator in an embodiment of the present invention. As can be seen from the figure, the ultra-high-speed comparator includes a sequentially connecte...

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Abstract

The invention provides an ultrahigh-speed comparator with low offset, and belongs to the technical field of composite signal integrated circuits. The comparator comprises a preamplification circuit, adynamic latch circuit and an output latch circuit which hare connected in sequence, wherein, the preamplification circuit comprises a fully differential input structure with a positive resistor and anegative resistor serially connected as load and is used for amplifying difference value between input signals and reference signals; the dynamic latch circuit is equipped with a bistable structure which is connected from head to tail by an inverter, and used for amplifying the output signals of the preamplification circuit and establishing preceding stage output to digital logic output level; and the output latch circuit is composed of two cross-coupled NMOS transistors and PMOS common source amplification input, and used for outputting preceding stage output in a latch time, and keeping output result of the dynamic latch circuit at high impedance state in a reset stage so as to reduce input offset voltage of the comparator, increase speed of the comparator and well meet requirements ofhigh-speed analog-to-digital converter design.

Description

technical field [0001] The invention relates to the technical field of mixed-signal integrated circuits, in particular to a low offset ultra-high-speed comparator. Background technique [0002] With the development of modern communication technology and signal processing technology, more and more analog signals need to be converted into digital signals for processing, so higher requirements are put forward for high-speed and high-precision analog-to-digital converters (ADC). But in ultra-high-speed analog-to-digital converters, the design of high-speed and high-precision comparators is the difficulty and bottleneck of the entire design. [0003] The structure of the existing high-speed comparator includes: a multi-level open-loop comparator, a latch comparator, a dynamic latch comparator and a pre-amplified latch comparator. Among them, the multi-level open-loop comparator is easy to achieve high speed and high precision. However, due to the limitation of the bandwidth of t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03K5/24H03M1/34
Inventor 杨银堂朱樟明韩宝妮刘帘曦
Owner 陕西光电子先导院科技有限公司
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