Unlock instant, AI-driven research and patent intelligence for your innovation.

Field emission device with anode coating

A field emission and anode technology, applied in the direction of cathode ray tube/electron beam tube, discharge tube cold cathode, discharge tube main electrode, etc., can solve problems such as cathode field emission degradation

Inactive Publication Date: 2009-12-30
EI DU PONT DE NEMOURS & CO
View PDF8 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These ions, radicals, and other reactive gases appear to degrade the field emission of the cathode by reacting with the electron-emitting material

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Field emission device with anode coating
  • Field emission device with anode coating
  • Field emission device with anode coating

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0047] Figure 1 shows the electric field that needs to be applied to keep the emission current constant for two different FED samples operating simultaneously in the same vacuum chamber. The curves formed by solid black squares correspond to samples with an unbaked phosphor layer, while the curves formed by hollow circles correspond to samples with a baked phosphor layer. The main difference between baked and unbaked phosphor layers is that the unbaked phosphor layer comprises a binder material (usually a polymer, in this case ethyl cellulose) still mixed with it. Phosphor, this is because the device has not been subjected to the typical baking process where the binder evaporates. In the samples with the baked phosphor layer, the phosphor layer was free from residual binder due to the volatilization described above.

[0048] Initially, the degradation rate (ie, the rate of increase in applied voltage required to keep the current emission current constant) was lower for sample...

Embodiment 2

[0050] Carbon was sputter-deposited as protective material onto an anode made of ITO (Indium Tin Oxide, a transparent conductive material). The carbon coating has a thickness of 22 nm and is amorphous in nature. The carbon-coated anode was mounted in a field emission device and the degradation rate of the emitter in this device was compared with that of a device in which the anode was made of ITO without any coating. In devices with coated anodes, the degradation rate was significantly lower than in devices with uncoated anodes, as shown in Figure 2. However, after about 75 hours, the degradation rate started to increase due to the consumption of the carbon layer. This can be seen if the anode is examined under a light microscope. Between 50-70 hours, the lower curve for the anode made only of ITO drops slightly due to the voltage limit of the DC bias applied to the anode.

Embodiment 3

[0052] The protective carbon on the anode need not be amorphous or sputter deposited. In this example, the ITO anode was spin-coated using a commercially available graphite coating (Neolube No. 2, Huron Industries Inc., Port Huron, MI 48061) containing A mixture of graphitic carbon and amorphous carbon. Figure 3 shows that the rate of emitter degradation in a field emission device fitted with such an anode is similar to that of the device in Example 2 with a carbon-coated anode. Simultaneously run the device with the ITO anode uncoated showed a much greater degradation rate, which was comparable to the performance of the device with the anode uncoated in Example 2.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to View More

Abstract

A field emission device in which a protective material is employed in relation to the anode wherein the protective material is selected from one or more members of the group consisting of amorphous carbon, graphite, diamond-like carbon, fullerenes, carbon nanotubes, a (co)polymer and an organic coating compound.

Description

[0001] This patent application claims priority to US Provisional Application 60 / 903,259, filed February 24, 2007, which is hereby incorporated by reference in its entirety in its entirety for all purposes. technical field [0002] The present invention relates to field emission devices in which a protective material for use in conjunction with an anode is provided. Background of the invention [0003] Field emission devices generate visible light for display or lighting applications, or x-rays for analytical instrumentation. A typical field emission device includes an anode and a cathode, with the cathode typically comprising a material with substantial electric field enhancement. The shape of the material can be, for example, conical or acicular in order to achieve the desired field enhancement when a voltage is applied to the cathode. [0004] A commonly used needle-like material in cathodes of field emission devices is carbon nanotubes ("CNTs"), which can be single-walle...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01J31/12H01J29/08
CPCH01J31/127H01J29/085H01J29/28H01J1/30H01J2329/00
Inventor A·芬尼摩尔D·H·罗奇L·-T·A·程
Owner EI DU PONT DE NEMOURS & CO
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com