A kind of preparation method of Gan-based LED chip
An LED chip, p-gan technology, applied in electrical components, circuits, semiconductor devices, etc., can solve problems such as poor P-type ohmic contact, increase series resistance, reduce device reliability, etc., to achieve good P-type ohmic contact, The effect of long device operating life and low forward operating voltage
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Embodiment 1
[0026] Deposit a layer of Zn film with a thickness of 200nm on the surface of the cleaned conventional LED epitaxial wafer P-GaN by sputtering, and use an excimer laser with a wavelength of 248nm to irradiate the Zn / P-GaN surface of the sample in an atmospheric environment. The pulse frequency is 20Hz, the single pulse energy is 300mJ, and the irradiation time is 2.5s. The remaining Zn was etched away with dilute hydrochloric acid, rinsed and dried with deionized water. Perform ICP etching on the processed sample to expose the n-type GaN layer, photolithography and sputtering the Ti(60nm) / Al(2nm) metal layer, and form an n-type electrode after peeling off, annealing in a nitrogen atmosphere at 700°C for 2min; The sample was subjected to photolithography again and a Ni / Au metal layer was sputtered on the surface, and a p-type electrode was formed after peeling off, and annealed in a nitrogen atmosphere at 550°C for 2 minutes.
Embodiment 2
[0028] Deposit a layer of Zn film with a thickness of 300nm on the surface of the cleaned conventional LED epitaxial wafer P-GaN by sputtering, use a KrF excimer laser to irradiate the Zn / P-GaN surface of the sample in an atmospheric environment, and the pulse of the laser The frequency is 25Hz, the single pulse energy is 350mJ, and the irradiation time is 2s. The remaining Zn was etched away with dilute hydrochloric acid, rinsed and dried with deionized water. Perform ICP etching on the processed sample to expose the n-type GaN layer, photolithography and sputtering the Ti(60nm) / Al(2nm) metal layer, peel off to form an n-type electrode, and anneal in a nitrogen atmosphere at 600°C for 4 minutes; The sample was subjected to photolithography again and a Ni / Au metal layer was sputtered on the surface, and a p-type electrode was formed after peeling off, and annealed in a nitrogen atmosphere at 500°C for 3 minutes.
Embodiment 3
[0030]Deposit a layer of 100nm thick Zn film on the surface of the cleaned conventional LED epitaxial wafer P-GaN by sputtering, and use a KrF excimer laser to irradiate the Zn / P-GaN surface of the sample in an atmospheric environment. The frequency is 30Hz, the single pulse energy is 250mJ, and the irradiation time is 3s. The remaining Zn was etched away with dilute hydrochloric acid, rinsed and dried with deionized water. Perform ICP etching on the processed sample to expose the n-type GaN layer, photolithography and sputtering the Ti(60nm) / Al(2nm) metal layer, and form an n-type electrode after peeling off, annealing in a nitrogen atmosphere at 650°C for 5min; The sample was subjected to photolithography again and a Ni / Au metal layer was sputtered on the surface, and a p-type electrode was formed after peeling off, and annealed in a nitrogen atmosphere at 600°C for 2 minutes.
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Abstract
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