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Vertical double-diffusion MOS transistor structure

A technology of MOS transistors and vertical double diffusion, which is applied in semiconductor devices, electrical components, circuits, etc., can solve the problems of mutual integration influence of MOS transistors, increase switching loss, device current and voltage performance degradation, etc., and shorten the charge and discharge time , Improve the switching speed and reduce the effect of dynamic loss

Inactive Publication Date: 2010-04-07
GRACE SEMICON MFG CORP
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Problems solved by technology

[0006] In the prior art, there are generally two ways to reduce the gate-drain capacitance Cgd of a MOS transistor: one way is to reduce the area of ​​the gate and the drain, but this method will bring a larger on-resistance Rds(on ), while increasing the switching loss, it will also cause a decrease in device current, voltage and other performance; another method is to reduce the relative contact area between the gate and the drain, usually using a certain method for the gate Shielding technology, thereby reducing the relative capacitance of the gate-drain, in the Chinese patent CN03817927.X, a semiconductor gate structure including a shielding electrode and a switch electrode is provided, although this structure reduces the gate-drain to a certain extent. Relative capacitance, but the structure involves more process steps, and the preparation method is more complicated, which increases the manufacturing cost of the MOS transistor. In addition, the structure involves multiple dielectric layers, and its dimensional accuracy is not easy to control, which affects other properties of the MOS transistor and MOS The mutual integration between devices has a certain influence

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  • Vertical double-diffusion MOS transistor structure
  • Vertical double-diffusion MOS transistor structure
  • Vertical double-diffusion MOS transistor structure

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Embodiment Construction

[0018] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0019] figure 2 It is a schematic diagram of a cross-sectional structure of a double-diffused MOS transistor provided by the present invention.

[0020] Such as figure 2 As shown, the vertical double diffused MOS transistor 200 includes: a semiconductor substrate 210 of the first conductivity type; an epitaxial layer 220 of the first conductivity type covering the surface of the semiconductor substrate 210; a layer of the first conductivity type located in the epitaxial layer 220 a source doped region 201 and a channel region 202 of the second conductivity type; a gate oxide layer 203 covering the surface of the epitaxial layer 220 except the source doped region 201; located on the upper surface of the gate oxide layer 203 and located in the horizontal directio...

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Abstract

The invention provides a vertical double-diffusion MOS transistor structure and belongs to the field of semiconductor devices. The vertical double-diffusion MOS transistor structure comprises a semiconductor substrate, an epitaxial layer, a source doped area, a channel area, a gate oxide layer and a polysilicon gate; moreover, a thick insulating layer is arranged between the polysilicon gate and the epitaxial layer at positions beside the channel area in a horizontal direction; and due to the introduction of the insulating layer, the relative distance between the polysilicon gate and the epitaxial layer is increased, namely the distance between two polar plates of a gate-drain capacitor is increased, so that under conditions of not changing the area of the polysilicon gate and not increasing the on resistance of the device, the gate-drain capacitor of the device is effectively reduced, the electrical charging-discharging time of the gate-drain capacitor in a process of opening or closing the MOS transistor is greatly shortened, the opening-closing speed of the MOS transistor is improved, the dynamic loss of the MOS transistor is lowered, and the performance of the device is greatly improved.

Description

technical field [0001] The invention relates to a MOS transistor structure, in particular to a double-diffused MOS transistor structure with a vertical structure, and belongs to the field of semiconductor devices. Background technique [0002] In semiconductor integrated circuits, the circuit based on double-diffused MOS transistors, referred to as DMOS, uses the difference in lateral diffusion speed of two impurity atoms to form a self-aligned sub-micron channel, which can achieve high operating frequency and speed. The DMOS transistors can be divided into two types: lateral DMOS transistors (LDMOS for short) and vertical DMOS transistors (VDMOS). Among them, vertical DMOS transistors are increasingly used in the field of semiconductor integrated circuits due to their good performance and high integration. [0003] Figure 1a It is a schematic cross-sectional structure diagram of a traditional vertical double-diffused MOS transistor (VDMOS for short) 100 . Such as Figur...

Claims

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Application Information

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IPC IPC(8): H01L29/78H01L29/06
Inventor 刘宪周克里丝张雨
Owner GRACE SEMICON MFG CORP
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