Method for manufacturing phase shift mask, method for manufacturing flat panel display, and phase shift mask
A phase shift mask and manufacturing method technology, which can be applied in the photoengraving process of the pattern surface, the manufacture of semiconductor/solid-state devices, instruments, etc., and can solve the problems of difficult developing conditions and the like
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no. 1 approach
[0036] figure 1 It is a process drawing for demonstrating the manufacturing method of the phase shift mask described in 1st Embodiment of this invention. The phase shift mask in this embodiment is a mask for patterning the glass substrate for flat panel displays, for example. As will be mentioned later, when patterning a glass substrate using this mask, the light used in the exposure process is composite light that combines i-line, h-line, and g-line having different wavelengths.
[0037]First, a light-shielding layer 11 is formed on a transparent substrate 10 ( figure 1 Middle (A)).
[0038] As the transparent substrate 10 , a material that is transparent and has good optical isotropy is used, for example, a quartz glass substrate can be used. The size of the transparent substrate 10 is not particularly limited, and can be appropriately selected according to the size of the substrate (for example, a substrate for a flat panel display or a semiconductor substrate) during th...
no. 2 approach
[0078] image 3 It is a process drawing for demonstrating the manufacturing method of the phase shift mask mentioned in 2nd Embodiment of this invention. Also, yes image 3 neutralize figure 1 Corresponding parts are denoted by the same symbols, and detailed description thereof will be omitted.
[0079] The phase shift mask 2 in this embodiment ( image 3 In (J)), a positioning mark for positioning is formed on the peripheral portion, and the positioning mark is formed by the light-shielding layer 11P2. Next, a method of manufacturing the phase shift mask 2 will be described.
[0080] First, a light-shielding layer 11 is formed on a transparent substrate 10 ( image 3 Middle (A)). Next, a photoresist film layer 12 is formed on the light shielding layer 11 ( image 3 Middle (B)). The photoresist film layer 12 can be positive or negative. Next, the photoresist film layer 12 is subjected to exposure and development processing, thereby forming a resist pattern 12P2 on the...
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Abstract
Description
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