Near infrared photoluminescent film and preparation methods thereof
A technology of photoluminescence and thin film, which is applied in the field of near-infrared photoluminescence thin film and its preparation, can solve the problems of low light absorption rate and limited utilization of sunlight by single crystal silicon, achieve high transmittance, and the method is simple and easy line effect
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Embodiment 1
[0041] Example 1, CdS 0.95 Se 0.05 Preparation of photoluminescent thin films
[0042] CdO 0.0128g, S powder 0.0015g and Se powder 0.0002g are dispersed in water to obtain an aqueous solution (wherein, the mass percentages of CdO, S powder and Se powder in the aqueous solution are respectively 5.12%, 0.60%, 0.08%). The solution was made into a film by pulling method, and then the film was dried in a drying oven with constant humidity and temperature (humidity was 30%, temperature was 40°C) for 6 hours, and then put into an Ar gas-protected calciner for further processing. Calcination for 4h, wherein the temperature of calcination is 300°C, to obtain CdS 0.95 Se 0.05 A photoluminescence thin film, the thickness of the thin film is 30nm.
[0043] The absorption-emission spectrogram of the thin film prepared in this embodiment is as follows figure 1 shown.
Embodiment 2
[0044] Embodiment 2, ZnSe 0.95 Te 0.05 Preparation of photoluminescent thin films
[0045] ZnO 0.0081g, Se powder 0.0037g and Te powder 0.0003g are dispersed in water to obtain an aqueous solution (wherein, the mass percentages of ZnO, Se powder and Te powder in the aqueous solution are respectively 3.24%, 1.48%, 0.12%), and use Spin-coat the solution into a film, then place the film in a drying oven with constant humidity and temperature (humidity is 30%, temperature is 40°C) to dry for 6h, and then put it into an Ar gas-protected calciner for further processing. Calcined for 10h, wherein the temperature of calcination is 600°C, to obtain ZnSe 0.95 Te 0.05 A photoluminescence thin film, the thickness of the thin film is 35nm.
[0046] The absorption-emission spectrogram of the thin film prepared in this embodiment is as follows figure 2 shown.
Embodiment 3
[0047] Example 3, Ag 2 Te 0.95 S 0.05 Preparation of photoluminescent thin films
[0048] Ag 2 O 0.0232g, Te powder 0.0061g and S powder 0.0001g are dispersed in water to obtain an aqueous solution (wherein, the Ag in the aqueous solution 2 The mass percentage composition of O, Te powder and S powder is respectively 9.28%, 2.44%, 0.04%), and this solution is made into film with spin coating method, then this film is placed in the oven of constant humidity and temperature (humidity 30%, the temperature is 40 ℃) after drying in 6h, put into the calcination furnace of Ar gas protection to carry out calcination 21h, wherein the temperature of calcination is 400 ℃, obtain Ag 2 Te 0.95 S 0.05 A photoluminescence thin film, the thickness of the thin film is 40nm.
[0049] The absorption-emission spectrogram of the thin film prepared in this embodiment is as follows image 3 shown.
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Abstract
Description
Claims
Application Information
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