Method for preparing semiconductor T-shaped gate electrode by utilizing photon beam super-diffraction technology
A super-diffraction and photon beam technology, applied in semiconductor devices, optomechanical equipment, optics, etc., can solve problems such as poor flexibility, high production cost, and low efficiency, and achieve small graphic feature sizes, low equipment operating costs, and total exposure. large area effect
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[0023] see Figure 1-Figure 8 As shown, the present invention provides a kind of method that utilizes photon beam superdiffraction technology to prepare semiconductor T-type grid electrode, comprises the steps:
[0024] Step 1: If figure 1 As shown, a dielectric passivation layer 20 is deposited on the sample 10 to be prepared with a T-shaped gate. The thickness of the dielectric passivation layer 20 is 50-100 nm, and the material of the dielectric passivation layer 20 is silicon nitride, silicon dioxide or Aluminum oxide; the material of the sample 10 can be gallium nitride, arsenic nitride or indium phosphide and other group III and five semiconductors, and can also be silicon;
[0025] Step 2: If figure 2 As shown, a resist 30 is coated on the dielectric passivation layer 20, and the resist 30 is electron beam glue or ordinary ultraviolet photoresist; according to the size of the gate foot pattern 31 to be obtained, electron beam can be used. Glue (gate pattern, ≤0.1μm)...
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Abstract
Description
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Application Information
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